Patents by Inventor Isabelle Duport-Schanen

Isabelle Duport-Schanen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Interferometric measuring device forming a spacial interference pattern
    Patent number: 5710629
    Abstract: Two input beams (10, 20) of the interferometric measuring device, achieved according to the integrated optics technology, are broadened so as to form two spread flat beams creating an interference pattern (30). Two detectors (14, 15) supply two measuring signals, preferably in phase quadrature, representative of two points of the interference plane.
    Type: Grant
    Filed: May 5, 1995
    Date of Patent: January 20, 1998
    Assignee: Schneider Electric S.A.
    Inventors: Antoine Kevorkian, Isabelle Duport-Schanen, Pierre Benech