Patents by Inventor Isamu Toba

Isamu Toba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200299095
    Abstract: A sheet transport device includes a transport unit, a load section, and a sheet accommodation section. The transport unit has a transport path along which a sheet read at a read position is transported to an output unit. The sheet output by the output unit is loaded onto the load section. The sheet accommodation section is disposed downstream in an output direction of the sheet from an inner wall surface extending upward adjacent to the load section and has a recess capable of accommodating a sheet of a predetermined minimum size. A retrieval space through which the sheet accommodated in the sheet accommodation section is retrievable is provided by exposing the transport path in a direction opposite to a loading direction of the sheet.
    Type: Application
    Filed: August 15, 2019
    Publication date: September 24, 2020
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Yosuke TAKAHASHI, Masato SERIKAWA, Takakiyo TOBA, Yuta ABE, Isamu ADACHI
  • Publication number: 20200299087
    Abstract: A sheet transport device includes a sheet load tray on which a sheet is loaded, a side-edge positioning unit, and a regulating unit. The side-edge positioning unit comes into contact with a side edge of the sheet in a direction intersecting a sheet transport direction at an upper surface of the sheet load tray and positions the side edge of the sheet to a normal position. The regulating unit is provided in a rotatable manner about a rotation shaft at a lower surface of the sheet load tray and regulates an output position of the sheet by rotating a stopper of the regulating unit to a position where the stopper is capable of colliding with a downstream edge of the sheet to be output in an output direction when the side-edge positioning unit moves to a position corresponding to a minimum width of the sheet.
    Type: Application
    Filed: August 14, 2019
    Publication date: September 24, 2020
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Masato SERIKAWA, Takakiyo TOBA, Yosuke TAKAHASHI, Isamu ADACHI, Yuta ABE
  • Publication number: 20200304667
    Abstract: A sheet transport device includes a sheet transport unit, a detector, and a releasing unit. The sheet transport unit transports a sheet by nipping the sheet in a nip between multiple pairs of transport rollers arranged in a sheet width direction intersecting a sheet transport direction. The detector detects a size of the transported sheet. The releasing unit releases the nip of one or more of the pairs of transport rollers outside a transport region of the sheet based on the size of the sheet detected by the detector.
    Type: Application
    Filed: August 15, 2019
    Publication date: September 24, 2020
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Isamu ADACHI, Takakiyo TOBA, Yosuke TAKAHASHI, Masato SERIKAWA, Yuta ABE
  • Patent number: 8654479
    Abstract: A thin film magnetic recording head having a multilayer structure in which plural thin films are laminated and being a perpendicular recording type that applies a magnetic field perpendicularly to a magnetic recording medium and performs recording, includes a main magnetic pole exposed on an air bearing surface facing the magnetic recording medium and guiding a magnetic flux toward the magnetic recording medium, a thin film positioned beneath the main magnetic pole from a perspective of a lamination direction and configuring a sensor or a heater configured to determine a distance from the magnetic recording medium of the thin film magnetic recording head, and a light-absorbing portion positioned between the main magnetic pole and the thin film.
    Type: Grant
    Filed: June 28, 2012
    Date of Patent: February 18, 2014
    Assignee: TDK Corporation
    Inventors: Masashi Sano, Hiromichi Umehara, Mutsumi Fujita, Isamu Toba, Tatsuhiro Nojima, Hitoshi Hatate, Hisayoshi Watanabe
  • Publication number: 20140002921
    Abstract: A thin film magnetic recording head having a multilayer structure in which plural thin films are laminated and being a perpendicular recording type that applies a magnetic field perpendicularly to a magnetic recording medium and performs recording, includes a main magnetic pole exposed on an air bearing surface facing the magnetic recording medium and guiding a magnetic flux toward the magnetic recording medium, a thin film positioned beneath the main magnetic pole from a perspective of a lamination direction and configuring a sensor or a heater configured to determine a distance from the magnetic recording medium of the thin film magnetic recording head, and a light-absorbing portion positioned between the main magnetic pole and the thin film.
    Type: Application
    Filed: June 28, 2012
    Publication date: January 2, 2014
    Applicant: TDK Corporation
    Inventors: Masashi SANO, Hiromichi Umehara, Mutsumi Fujita, Isamu Toba, Tatsuhiro Nojima, Hitoshi Hatate, Hisayoshi Watanabe
  • Patent number: 8373947
    Abstract: A magnetic head slider includes a magnetic recording part and/or a reproducing part. The magnetic head slider includes a resistance film having temperature dependence of electrical resistance, the resistance film being positioned in the vicinity of an air bearing surface or on the air bearing surface, separately from the magnetic recording part and the reproducing part. The magnetic head slider further includes a first protective film with a smaller milling rate than the resistance film, the first protective film contacting a lower surface of the resistance film in a lamination direction of the magnetic head slider and on the air bearing surface, and/or a second protective film with a smaller milling rate than the resistance film, the second protective film contacting an upper surface of the resistance film in the lamination direction of the magnetic head slider and on the air bearing surface.
    Type: Grant
    Filed: September 29, 2011
    Date of Patent: February 12, 2013
    Assignee: TDK Corporation
    Inventors: Tatsuhiro Nojima, Masashi Sano, Yosuke Antoku, Mutsumi Fujita, Isamu Toba, Norio Takahashi, Hideyuki Ukita
  • Patent number: 8072706
    Abstract: A main magnetic pole includes a first part extending from a medium facing surface to a point at a predetermined distance from the medium facing surface, and a second part other than the first part. An accommodation part for accommodating the main magnetic pole includes: a first layer having a groove; a second layer lying between the first layer and the main magnetic pole in the first layer's groove; and a third layer interposed in part between the second layer and the main magnetic pole in the first layer's groove. The second layer is formed of a metal material different from a material used to form the first layer. The third layer is formed of an inorganic insulating material. The second and third layers lie between the first layer and the first part. The second layer lies between the bottom of the first layer's groove and the second part, but the third layer does not. The distance between the bottom of the first layer's groove and the second part is smaller than that between the bottom and the first part.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: December 6, 2011
    Assignee: TDK Corporation
    Inventors: Kei Hirata, Hideyuki Ukita, Shin Narushima, Isamu Toba, Hiromichi Umehara, Hisayoshi Watanabe, Hideyuki Yatsu
  • Patent number: 8072231
    Abstract: A testing method of a wafer provided with a plurality of thin-film magnetic heads is provided. Each of the plurality of thin-film magnetic heads includes a main pole layer, a first test pad formed on the wafer and electrically connected with an extended top end section of the main pole layer and a second test pad formed on the wafer and electrically connected with a back end section of the main pole layer. The testing method includes a step of measuring an electrical resistance between the first test pad and the second test pad, a step of judging whether the measured electrical resistance is within a set range, and a step of discriminating that the thin-film magnetic head is a non-defective product when the measured electrical resistance is within the set range.
    Type: Grant
    Filed: May 28, 2009
    Date of Patent: December 6, 2011
    Assignee: TDK Corporation
    Inventors: Isamu Toba, Yasuhiro Hasegawa, Koichi Otani, Takamitsu Sakamoto
  • Publication number: 20110090595
    Abstract: A main magnetic pole includes a first part extending from a medium facing surface to a point at a predetermined distance from the medium facing surface, and a second part other than the first part. An accommodation part for accommodating the main magnetic pole includes: a first layer having a groove; a second layer lying between the first layer and the main magnetic pole in the first layer's groove; and a third layer interposed in part between the second layer and the main magnetic pole in the first layer's groove. The second layer is formed of a metal material different from a material used to form the first layer. The third layer is formed of an inorganic insulating material. The second and third layers lie between the first layer and the first part. The second layer lies between the bottom of the first layer's groove and the second part, but the third layer does not. The distance between the bottom of the first layer's groove and the second part is smaller than that between the bottom and the first part.
    Type: Application
    Filed: October 15, 2009
    Publication date: April 21, 2011
    Applicant: TDK CORPORATION
    Inventors: Kei Hirata, Hideyuki Ukita, Shin Narushima, Isamu Toba, Hiromichi Umehara, Hisayoshi Watanabe, Hideyuki Yatsu
  • Publication number: 20100302662
    Abstract: A testing method of a wafer provided with a plurality of thin-film magnetic heads is provided. Each of the plurality of thin-film magnetic heads includes a main pole layer, a first test pad formed on the wafer and electrically connected with an extended top end section of the main pole layer and a second test pad formed on the wafer and electrically connected with a back end section of the main pole layer. The testing method includes a step of measuring an electrical resistance between the first test pad and the second test pad, a step of judging whether the measured electrical resistance is within a set range, and a step of discriminating that the thin-film magnetic head is a non-defective product when the measured electrical resistance is within the set range.
    Type: Application
    Filed: May 28, 2009
    Publication date: December 2, 2010
    Applicant: TDK CORPORATION
    Inventors: Isamu TOBA, Yasuhiro HASEGAWA, Koichi OTANI, Takamitsu SAKAMOTO