Abstract: The method includes determining an oxide layer removal energy density threshold from a section of the product, including transmitting, to a segment of the section, analyzing pulses of wavelength and of pulse duration equal to those of the stripping lasers to form a stripped region, capturing an image of the segment, determining, from this image, a dimension representative of the stripped region and evaluating, from the dimension, the removal energy density threshold; transmitting stripping pulses to the section, the energy density of the stripping pulses being higher than the removal energy density threshold, the stripping laser being controlled in such a way that every point of the section is exposed to an energy density higher than the removal energy density threshold.