Patents by Inventor Itamar Shani

Itamar Shani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250038739
    Abstract: A system comprises pulse program compiler circuitry operable to analyze a pulse program that includes a pulse operation statement, and to generate, based on the pulse program, machine code that, if loaded into a pulse generation and measurement circuit, configures the pulse generation and measurement circuit to generate one or more pulses and/or process one or more received pulses. The pulse operation statement may specify a first pulse to be generated, and a target of the first pulse. The pulse operation statement may specify parameters to be used for processing of a return signal resulting from transmission of the first pulse. The pulse operation statement may specify an expression to be used for processing of the first pulse by the pulse generation and measurement circuit before the pulse generation and measurement circuit sends the first pulse to the target.
    Type: Application
    Filed: March 6, 2024
    Publication date: January 30, 2025
    Inventors: Yonatan Cohen, Nissim Ofek, Itamar Sivan, Tal Shani
  • Publication number: 20240404784
    Abstract: Disclosed herein is a system for non-destructive tomography of specimens. The system includes a scanning electron microscope (SEM) and a processor(s). The SEM is configured to obtain a sinogram of a tested specimen, parameterized by a vector {right arrow over (s)}, by projecting e-beams on the tested specimen, at each of a plurality of projection directions and offsets, and. for each e-beam, measuring a respective intensity of electrons returned from the tested specimen, The processor(s) is configured to obtain a tomographic map, pertaining to the tested specimen, by determining values indicative of components of a vector {right arrow over (t)} defined by an equation W{right arrow over (t)}={right arrow over (s)}. W is a matrix with components wij specifying a contribution of a j-th voxel in a nominal specimen to an i-th element of a nominal sinogram of the nominal specimen. The matrix W accounts for e-beam expansion and attenuation with depth within the nominal specimen.
    Type: Application
    Filed: May 29, 2023
    Publication date: December 5, 2024
    Applicant: Applied Materials Israel Ltd.
    Inventors: Itamar Shani, Konstantin Chirko, Lior Yaron, Guy Eytan, Guy Shwartz
  • Patent number: 11816558
    Abstract: An integrated circuit device for reservoir computing can include a weighted input layer, an unweighted, asynchronous, internal recurrent neural network made up of nodes having binary weighting, and a weighted output layer. Weighting of output signals can be performed using predetermined weighted sums stored in memory. Application specific integrated circuit (ASIC) embodiments may include programmable nodes. Characteristics of the reservoir of the device can be tunable to perform rapid processing and pattern recognition of signals at relatively large rates.
    Type: Grant
    Filed: May 16, 2018
    Date of Patent: November 14, 2023
    Assignee: UNIVERSITY OF MARYLAND, COLLEGE PARK
    Inventors: Daniel Lathrop, Itamar Shani, Peter Megson, Alessandro Restelli, Anthony Robert Mautino
  • Publication number: 20230326713
    Abstract: Disclosed herein is a method for non-destructive hybrid acousto-optic and scanning electron microscopy-based metrology. The method includes: (i) obtaining acousto-optic and scanning electron microscopy measurement data of an inspected structure on a sample; (ii) processing the measurement data to extract values of key measurement parameters corresponding to the acousto-optic measurement data and the scanning electron microscopy measurement data, respectively; and (iii) obtaining estimated values of one or more structural parameters of the inspected structure by inputting the extracted values into an algorithm, which is configured to jointly process the extracted values to output estimated values of the one or more structural parameters.
    Type: Application
    Filed: April 6, 2022
    Publication date: October 12, 2023
    Applicant: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Guy Shwartz, Ori Golani, Itamar Shani, Ido Almog
  • Patent number: 11264202
    Abstract: A method, a non-transitory computer readable medium and a three-dimensional evaluation system for providing three dimensional information regarding structural elements of a specimen. The method can include illuminating the structural elements with electron beams of different incidence angles, where the electron beams pass through the structural elements and the structural elements are of nanometric dimensions; detecting forward scattered electrons that are scattered from the structural elements to provide detected forward scattered electrons; and generating the three dimensional information regarding structural elements based at least on the detected forward scattered electrons.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: March 1, 2022
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Konstantin Chirko, Itamar Shani, Albert Karabekov, Guy Eytan, Lior Yaron, Alon Litman
  • Publication number: 20210406648
    Abstract: An integrated circuit device for reservoir computing can include a weighted input layer, an unweighted, asynchronous, internal recurrent neural network made up of nodes having binary weighting, and a weighted output layer. Weighting of output signals can be performed using predetermined weighted sums stored in memory. Application specific integrated circuit (ASIC) embodiments may include programmable nodes. Characteristics of the reservoir of the device can be tunable to perform rapid processing and pattern recognition of signals at relatively large rates.
    Type: Application
    Filed: May 16, 2018
    Publication date: December 30, 2021
    Inventors: Daniel Lathrop, Itamar Shani, Peter Megson, Alessandro Restelli, Anthony Robert Mautino
  • Publication number: 20210358712
    Abstract: A method, a non-transitory computer readable medium and a three-dimensional evaluation system for providing three dimensional information regarding structural elements of a specimen. The method can include illuminating the structural elements with electron beams of different incidence angles, where the electron beams pass through the structural elements and the structural elements are of nanometric dimensions; detecting forward scattered electrons that are scattered from the structural elements to provide detected forward scattered electrons; and generating the three dimensional information regarding structural elements based at least on the detected forward scattered electrons.
    Type: Application
    Filed: May 18, 2020
    Publication date: November 18, 2021
    Applicant: Applied Materials Israel Ltd.
    Inventors: Konstantin Chirko, Itamar Shani, Albert Karabekov, Guy Eytan, Lior Yaron, Alon Litman