Patents by Inventor Itay Gur-Arie

Itay Gur-Arie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR
    Publication number: 20160094760
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: December 10, 2015
    Publication date: March 31, 2016
    Applicant: Orbotech Ltd.
    Inventors: Yigal KATZIR, Itay GUR-ARIE, Yacov MALINOVICH
  • Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
    Patent number: 9232114
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: August 14, 2013
    Date of Patent: January 5, 2016
    Assignee: Orbotech Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR
    Publication number: 20130329103
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: August 14, 2013
    Publication date: December 12, 2013
    Applicant: Orbotech Ltd.
    Inventors: Yigal KATZIR, Itay GUR-ARIE, Yacov MALINOVICH
  • Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
    Patent number: 8536506
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: January 17, 2012
    Date of Patent: September 17, 2013
    Assignee: Orbotech Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR
    Publication number: 20120206634
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: January 17, 2012
    Publication date: August 16, 2012
    Applicant: ORBOTECH LTD.
    Inventors: Yigal KATZIR, Itay GUR-ARIE, Yacov MALINOVICH
  • Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
    Patent number: 8119969
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: January 26, 2011
    Date of Patent: February 21, 2012
    Assignee: Orbotech Ltd
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR
    Publication number: 20110114823
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: January 26, 2011
    Publication date: May 19, 2011
    Applicant: ORBOTECH LTD.
    Inventors: Yigal KATZIR, Itay GUR-ARIE, Yacov MALINOVICH
  • Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
    Patent number: 7897902
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: July 24, 2008
    Date of Patent: March 1, 2011
    Assignee: Orbotech Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • HIGH-SENSITIVITY OPTICAL SCANNING USING MEMORY INTEGRATION
    Publication number: 20080278775
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: July 24, 2008
    Publication date: November 13, 2008
    Applicant: Orbotech Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • High-sensitivity optical scanning using memory integration
    Patent number: 7417243
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: August 26, 2008
    Assignee: Orbotech Ltd
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • HIGH-SENSITIVITY OPTICAL SCANNING USING MEMORY INTEGRATION
    Publication number: 20070012865
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: September 18, 2006
    Publication date: January 18, 2007
    Applicant: ORBOTECH LTD.
    Inventors: Yigal KATZIR, Itay GUR-ARIE, Yacov MALINOVICH
  • High-sensitivity optical scanning using memory integration
    Patent number: 7129509
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: September 14, 2005
    Date of Patent: October 31, 2006
    Assignee: Orbotech, Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • High-sensitivity optical scanning using memory integration
    Patent number: 7009163
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Grant
    Filed: June 21, 2002
    Date of Patent: March 7, 2006
    Assignee: Orbotech Ltd.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • High-sensitivity optical scanning using memory integration
    Publication number: 20060006311
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: September 14, 2005
    Publication date: January 12, 2006
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • Optical inspection system employing a staring array scanner
    Patent number: 6864498
    Abstract: A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article and the sensor at a generally uniform rate of displacement, and a field of view freezer operative to provide a generally motionless image during image acquisition. The scanner system is particularly useful in the field of automated optical inspection.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: March 8, 2005
    Assignee: Orbotech Ltd.
    Inventors: Yigal Katzir, Avraham Adler, Itay Gur-Arie
  • High-sensitivity optical scanning using memory integration
    Publication number: 20030006364
    Abstract: An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report.
    Type: Application
    Filed: June 21, 2002
    Publication date: January 9, 2003
    Applicant: ORBOTECH LTD.
    Inventors: Yigal Katzir, Itay Gur-Arie, Yacov Malinovich
  • Optical inspection system employing a staring array scanner
    Publication number: 20020166983
    Abstract: A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article the sensor at a generally uniform rate of displacement, and a field of view freezer operative to provide a generally motionless image during image acquisition. The scanner system is particularly useful in the field of automated optical inspection.
    Type: Application
    Filed: May 10, 2002
    Publication date: November 14, 2002
    Applicant: ORBOTECH LTD
    Inventors: Yigal Katzir, Avraham Adler, Itay Gur-Arie