Patents by Inventor Ivan E. Ivanov

Ivan E. Ivanov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High temperature probe card
    Patent number: 6667631
    Abstract: The probe card of the present invention permits testing of a semiconductor device-under-test under high temperatures and includes a plurality of printed circuit boards stacked together to form a probe interface board having a top surface and a lower testing face. A heat sink is mounted on the probe interface board at the top surface and extends to the lower testing face. A needle supporting module is carried by the heat sink at the lower testing face and has a plurality of probe needles for electrically connecting to electrical contacts of a semiconductor device-under-test.
    Type: Grant
    Filed: December 27, 2001
    Date of Patent: December 23, 2003
    Assignee: STMicroelectronics, Inc.
    Inventor: Ivan E. Ivanov
  • High temperature probe card
    Publication number: 20030146770
    Abstract: The probe card of the present invention permits testing of a semiconductor device-under-test under high temperatures and includes a plurality of printed circuit boards stacked together to form a probe interface board having a top surface and a lower testing face. A heat sink is mounted on the probe interface board at the top surface and extends to the lower testing face. A needle supporting module is carried by the heat sink at the lower testing face and has a plurality of probe needles for electrically connecting to electrical contacts of a semiconductor device-under-test.
    Type: Application
    Filed: December 27, 2001
    Publication date: August 7, 2003
    Applicant: STMicroelectronics, Inc.
    Inventor: Ivan E. Ivanov