Patents by Inventor Ivo W. Rangelow
Ivo W. Rangelow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8997258Abstract: A microscope probe includes a substrate; an optical resonator disposed on the substrate and including an optical resonance property; a displacement member disposed on the substrate and separated from the optical resonator, the displacement member including: a first end disposed distal to the optical resonator; and a second end disposed proximate to the optical resonator; and a coupling member disposed on the substrate and connecting the displacement member to the substrate, wherein the first end is configured to probe a sample and to be displaced in response to a condition of the sample, the displacement member is configured to communicate displacement of the first end to the second end, and the second end is configured to change the optical resonance property in response to displacement of the second end.Type: GrantFiled: May 23, 2014Date of Patent: March 31, 2015Assignees: National Institute of Standards and Technology, University of Maryland, College ParkInventors: Vladimir Aksyuk, Kartik Srinivasan, Houxun Miao, Ivo W. Rangelow, Thomas Michels
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Publication number: 20140338074Abstract: A microscope probe includes a substrate; an optical resonator disposed on the substrate and including an optical resonance property; a displacement member disposed on the substrate and separated from the optical resonator, the displacement member including: a first end disposed distal to the optical resonator; and a second end disposed proximate to the optical resonator; and a coupling member disposed on the substrate and connecting the displacement member to the substrate, wherein the first end is configured to probe a sample and to be displaced in response to a condition of the sample, the displacement member is configured to communicate displacement of the first end to the second end, and the second end is configured to change the optical resonance property in response to displacement of the second endType: ApplicationFiled: May 23, 2014Publication date: November 13, 2014Applicant: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYInventors: VLADIMIR AKSYUK, KARTIK SRINIVASAN, HOUXUN MIAO, IVO W. RANGELOW, THOMAS MICHELS
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Patent number: 8689359Abstract: The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator.Type: GrantFiled: June 26, 2008Date of Patent: April 1, 2014Assignee: Nano Analytik GmbHInventors: Ivo W. Rangelow, Tzvetan Ivanov, Burkhard Volland, Teodor Gotszalk, Miroslaw Woszczyna, Jerzy Mielczarski, Yanko Sarov
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Patent number: 8479311Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.Type: GrantFiled: December 10, 2008Date of Patent: July 2, 2013Assignees: Technische Universitat Ilmenau, Synchrotron Soleil, The Regents of the University of CaliforniaInventors: Stefan Kubsky, Deirdre Olynick, Peter Schuck, Jan Meijer, Ivo W. Rangelow
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Patent number: 8312561Abstract: The invention relates to a device and a method for the micromechanical positioning and handling of an object. The aim of the invention is to provide a device and an associated method for the micromechanical positioning and handling of objects by means of which the scanning speed can be increased and the positional accuracy be improved so that real time images or video rate images (ca. 25 images per second) having a lateral and vertical resolution in the nanometer range can be achieved. According to the invention, a monolithic component, preferably made of silicon, comprises a support element, an object carrier, a plurality of guide elements and elements for transmitting the movement, the preferably piezoresistive drive elements and the preferably piezoresistive position detectors being integrated into said monolithic component; Said micromechanical positioning device can be used, for example, in scanning probe microscopy and in nanopositioning and nanomanipulation technology.Type: GrantFiled: January 28, 2008Date of Patent: November 13, 2012Assignee: Technische Universitaet IlmenauInventors: Ivo W. Rangelow, Stefan Klett, Eishad Guliyev, Tzvetan Ivanov, Burkhard Volland
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Publication number: 20110055985Abstract: The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device.Type: ApplicationFiled: December 10, 2008Publication date: March 3, 2011Applicants: TECHNISCHE UNIVERSITAT ILMENAU, SYNCHROTRON SOLEIL, THE REGENTS OF THE UNIVERSITY OF CALIFORNIAInventors: Stefan Kubsky, Deirdre Olynick, Peter Schuck, Jan Meijer, Ivo W. Rangelow
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Publication number: 20110047662Abstract: The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator.Type: ApplicationFiled: June 26, 2008Publication date: February 24, 2011Inventors: Ivo W. Rangelow, Tzvetan Ivanov, Burkhard Volland, Teodor Gotszalk, Miroslaw Woszczyna
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Publication number: 20100017921Abstract: The invention relates to a device and a method for the micromechanical positioning and handling of an object. The aim of the invention is to provide a device and an associated method for the micromechanical positioning and handling of objects by means of which the scanning speed can be increased and the positional accuracy be improved so that real time images or video rate images (ca. 25 images per second) having a lateral and vertical resolution in the nanometer range can be achieved. According to the invention, a monolithic component, preferably made of silicon, comprises a support element, an object carrier, a plurality of guide elements and elements for transmitting the movement, the preferably piezoresistive drive elements and the preferably piezoresistive position detectors being integrated into said monolithic component; Said micromechanical positioning device can be used, for example, in scanning probe microscopy and in nanopositioning and nanomanipulation technology.Type: ApplicationFiled: January 28, 2008Publication date: January 21, 2010Applicant: TECHNISCHE UNIVERSITAET ILMENAUInventors: Ivo W. Rangelow, Stefan Klett, Eishad Guliyev, Tzvetan Ivanov, Burkhard Volland
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Patent number: 7126139Abstract: A device and a method for positionally accurate implantation of individual particles in a substrate surface (1a) are described. A diaphragm for a particle beam to be directed onto the substrate surface (1a) and a detector provided thereon in the form of a p-n junction for determining a secondary electron flow produced upon impact of a particle onto the substrate surface (1a) are provided on a tip (4) which is formed on a free end portion of a flexible arm (2) to be mounted on one side. The device is part of a scanning device operating according to the AFM method.Type: GrantFiled: October 9, 2003Date of Patent: October 24, 2006Assignee: The Regents of the University of CaliforniaInventors: Thomas Schenkel, Ivo W. Rangelow, Jan Meijer