Patents by Inventor J. Balazs Rozsa

J. Balazs Rozsa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240010913
    Abstract: The present invention relates to novel red fluorescent sensors for detecting metal ions, preferably zinc ions, which have a chemical structure corresponding to a compound of general formula I. These sensors are very useful for determining the concentration and distribution of zinc in living cells or tissues, preferably in a laser microscopic assay.
    Type: Application
    Filed: December 4, 2021
    Publication date: January 11, 2024
    Applicant: FEMTONICS KFT.
    Inventors: J. Balázs RÓZSA, Gergely KATONA, Zoltán MUCSI, Ervin KOVÁCS, Attila CSOMOS
  • Patent number: 9229207
    Abstract: A laser scanning reflection or fluorescent microscope is provided with focusing-detecting unit having a laser beam focusing objective, an image detector that detects light reflected from the sample or back fluoresced light emitted by the sample, and a drive that simultaneously displaces the objective and the image detector.
    Type: Grant
    Filed: November 15, 2013
    Date of Patent: January 5, 2016
    Assignee: Femtonics Kft
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa
  • Patent number: 9081173
    Abstract: A laser scanning microscope is provided with a laser beam focusing device, a drive for the focusing device, a laser beam deflector, and a control system that coordinates movement of the focusing device with that of the laser beam deflector.
    Type: Grant
    Filed: July 14, 2009
    Date of Patent: July 14, 2015
    Assignee: Femtonics Kft.
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa
  • Patent number: 9030547
    Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed.
    Type: Grant
    Filed: November 17, 2009
    Date of Patent: May 12, 2015
    Assignee: Femtonics Kft.
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa, Attila Kaszas, Gergely Turi
  • Publication number: 20140055852
    Abstract: A laser scanning reflection or fluorescent microscope is provided with focusing-detecting unit having a laser beam focusing objective, an image detector that detects light reflected from the sample or back fluoresced light emitted by the sample, and a drive that simultaneously displaces the objective and the image detector.
    Type: Application
    Filed: November 15, 2013
    Publication date: February 27, 2014
    Applicant: Femtonics Kft.
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa
  • Patent number: 8559085
    Abstract: A focusing system for focusing an electromagnetic beam for three-dimensional random access applications comprises a first pair of acousto-optic deflectors for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors for focusing an electromagnetic beam in a Y-Z plane substantially perpendicular to the X-Z plane. The second pair of acousto-optic deflectors is arranged between the acousto-optic deflectors of the first pair of acousto-optic deflectors such that the first and fourth acousto-optic deflectors of the system belong to the first pair of acousto-optic deflectors and the second and third acousto-optic deflectors of the system belong to the second pair of acousto-optic deflectors.
    Type: Grant
    Filed: December 30, 2009
    Date of Patent: October 15, 2013
    Assignee: Femtonics Kft.
    Inventors: Pal Andor Maak, J. Balazs Rozsa, Gergely Katona, E. Szilveszter Vizi, Mate Veress, Attila Csakanyi, Gergely Szalay
  • Publication number: 20120044569
    Abstract: The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12?) of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12?) of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22?) of the system belong to the second pair of acousto-optic deflectors (20).
    Type: Application
    Filed: December 30, 2009
    Publication date: February 23, 2012
    Applicant: FEMTONICS KFT.
    Inventors: Pal Andor Maak, J. Balazs Rozsa, Gergely Katona, E. Szilveszter Vizi, Mate Veress, Attila Csakanyi, Gergely Szalay
  • Publication number: 20110279893
    Abstract: The present invention relates to a laser scanning microscope (10) for scanning a sample, the microscope having focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13), drive means (18) for displacing the at least one optical element of the focusing means (15), at least one detector means (24?) for detecting light (13?) reflected from the sample or back fluoresced light (13?) emitted by the sample, characterised by the detector means (24?) being connected to the drive means (18) such that the drive means (18) may simultaneously displace the detector means (24?) with the at least one optical element of the focusing means (15). The present invention further relates to a method of performing 3D scanning with the inventive laser scanning microscope.
    Type: Application
    Filed: November 17, 2009
    Publication date: November 17, 2011
    Applicant: Femtonics Kft.
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa
  • Publication number: 20110279667
    Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed.
    Type: Application
    Filed: November 17, 2009
    Publication date: November 17, 2011
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa, Attila Kaszas, Gergely Turi
  • Publication number: 20110211254
    Abstract: The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined.
    Type: Application
    Filed: July 14, 2009
    Publication date: September 1, 2011
    Inventors: E. Szilveszter Vizi, Gergely Katona, J. Balazs Rozsa