Abstract: Delay-locked loops, signal locking methods and devices incorporating delay-locked loops are described. A delay-locked loop includes a forward loop path, a feedback loop path, and a phase detector. A test clock signal is temporarily switched to traverse the forward loop path and the feedback loop path. The phase detector is coupled to both the forward and feedback loop path circuits and is configured to periodically adjust responsive to a calculated loop delay of the test clock signal. The phase detector is thereafter able to stabilize at an improved rate.

Abstract: Delay-locked loops, signal locking methods and devices and systems incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the internal test signal into the forward delay path and measures the time of traversal of the internal test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.

Abstract: Delay-locked loops, signal locking methods and devices and systems incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the internal test signal into the forward delay path and measures the time of traversal of the internal test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.

Abstract: A timing domain crossing apparatus and method of transferring signals between timing domains are disclosed. A receiver samples a data signal with a sample clock in a first timing domain. The sampled data signal is expanded to a plurality of expansion signals, which are held valid for a plurality of consecutive active clock cycles. A data order adjuster may re-order the plurality of expansion signals to a predetermined order. A timing generator samples a command signal with an internal clock in a second timing domain to generate a re-timing strobe. The re-timing strobe may be temporally positioned to be within the expansion data window and used to sample the plurality of expansion signals in the second timing domain. The timing domain crossing apparatus and method of signal sampling may be incorporated in a semiconductor device, which may be fabricated on a semiconductor wafer and included in an electronic system.

Abstract: Delay-locked loops, signal locking methods and devices and system incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the test signal into the forward delay path and measures the time of traversal of the test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.

Abstract: A timing domain crossing apparatus and method of transferring signals between timing domains are disclosed. A receiver samples a data signal with a sample clock in a first timing domain. The sampled data signal is expanded to a plurality of expansion signals, which are held valid for a plurality of consecutive active clock cycles. A data order adjuster may re-order the plurality of expansion signals to a predetermined order. A timing generator samples a command signal with an internal clock in a second timing domain to generate a re-timing strobe. The re-timing strobe may be temporally positioned to be within the expansion data window and used to sample the plurality of expansion signals in the second timing domain. The timing domain crossing apparatus and method of signal sampling may be incorporated in a semiconductor device, which may be fabricated on a semiconductor wafer and included in an electronic system.

Abstract: Delay-locked loops, signal locking methods and devices and system incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the test signal into the forward delay path and measures the time of traversal of the test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.

Abstract: Delay-locked loops, signal locking methods and devices and system incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the test signal into the forward delay path and measures the time of traversal of the test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.