Patents by Inventor J. Daniel Bryan

J. Daniel Bryan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10429439
    Abstract: An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB. The space transformer can include a plurality of traces. Each of the plurality of probes can be connected to one of the plurality of traces.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: October 1, 2019
    Assignee: Intel Corporation
    Inventors: Dae-Woo Kim, J. Daniel Bryan, Joseph W. Parks, Jr., Ethan Caughey, Mark W. Dryfuse
  • Publication number: 20180003765
    Abstract: An apparatus for testing a die can comprise a first printed circuit board (PCB), a space transformer, and a plurality of probes. The first PCB can be configured to connect to a second PCB. The space transformer can be attached to the PCB. The space transformer can include a plurality of traces. Each of the plurality of probes can be connected to one of the plurality of traces. The plurality of probes can be arranged in a pattern having a pitch less than 65 microns.
    Type: Application
    Filed: July 1, 2016
    Publication date: January 4, 2018
    Inventors: Dae-Woo Kim, J. Daniel Bryan, Joseph W. Parks, JR., Ethan Caughey, Mark W. Dryfuse