Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: Technology relating to tuning for operating memory devices is disclosed. The technology includes a computing device that selectively configures operating parameters for at least one operating memory device based at least in part of performance characteristics for an application or other workload that the computing device has been requested to execute. This technology may be implemented, at least in part, in the firmware via a Basic Input/Output System (BIOS) or Unified Extensible Firmware Interface (UEFI) of the computing device. Further, this technology may be employed by a computing device that is executing workloads on behalf of a distributed computing system, e.g., in a data center. Such data centers may include, for example, thousands of computing devices and even more operating memory devices.

Abstract: A volatile memory data save subsystem may include a coupling to a shared power source such as a chassis or rack battery, or generator. A data save trigger controller sends a data save command toward coupled volatile memory device(s) such as NVDIMMs and PCIe devices under specified conditions: a programmable amount of time passes without AC power, a voltage level drops below normal but is still sufficient to power the volatile memory device during a data save operation, the trigger controller is notified of an operating system shutdown command, or the trigger controller is notified of an explicit data save command without a system shutdown command. NVDIMMs can avoid reliance on dedicated supercapacitors and dedicated batteries. An NVDIMM may perform an asynchronous DRAM reset in response to the data save command. Voltage step downs may be coordinated among power supplies. After data is saved, power cycles and the system reboots.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: According to one example of the present disclosure, a system includes a computing element configured to provide requests for memory access operations and a memory module comprising a plurality of memories, a plurality of independent data channels, each of the independent data channels coupled to one of the plurality of memories, a plurality of internal address/control channels, each of the independent address/control channels coupled to one of the plurality of memories, and control logic coupled to the plurality of internal address/control channels and configured to receive and decode address and control information for a memory access operation, the control logic further configured to selectively provide the decoded address and control information to a selected internal address/control channel for a selected independent data channel of the plurality of independent data channels based on the received address and control information for the memory access operation.

Abstract: The present invention is directed generally to systems and methods which provide a memory module having multiple data channels that are independently accessible (i.e., a multi-data channel memory module). According to one embodiment, the multi-data channel memory module enables a plurality of independent sub-cache-block accesses to be serviced simultaneously. In addition, the memory architecture also supports cache-block accesses. For instance, multiple ones of the data channels may be employed for servicing a cache-block access. In one embodiment a DIMM architecture that comprises multiple data channels is provided. Each data channel supports a sub-cache-block access, and multiple ones of the data channels may be used for supporting a cache-block access. The plurality of data channels to a given DIMM may be used simultaneously to support different, independent memory access operations.

Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry. A storage device controller includes an embedded test program. The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns to test shared power circuitry of storage device components (e.g., shared by an array of NAND flash memory devices). The test program identifies a command pattern that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

Abstract: A volatile memory data save subsystem may include a coupling to a shared power source such as a chassis or rack battery, or generator. A data save trigger controller sends a data save command toward coupled volatile memory device(s) such as NVDIMMs and PCIe devices under specified conditions: a programmable amount of time passes without AC power, a voltage level drops below normal but is still sufficient to power the volatile memory device during a data save operation, the trigger controller is notified of an operating system shutdown command, or the trigger controller is notified of an explicit data save command without a system shutdown command. NVDIMMs can avoid reliance on dedicated supercapacitors and dedicated batteries. An NVDIMM may perform an asynchronous DRAM reset in response to the data save command. Voltage step downs may be coordinated among power supplies. After data is saved, power cycles and the system reboots.

Abstract: The present invention is directed generally to systems and methods which provide a memory module having multiple data channels that are independently accessible (i.e., a multi-data channel memory module). According to one embodiment, the multi-data channel memory module enables a plurality of independent sub-cache-block accesses to be serviced simultaneously. In addition, the memory architecture also supports cache-block accesses. For instance, multiple ones of the data channels may be employed for servicing a cache-block access. In one embodiment a DIMM architecture that comprises multiple data channels is provided. Each data channel supports a sub-cache-block access, and multiple ones of the data channels may be used for supporting a cache-block access. The plurality of data channels to a given DIMM may be used simultaneously to support different, independent memory access operations.

Abstract: The present invention is directed generally to systems and methods which provide a memory module having multiple data channels that are independently accessible (i.e., a multi-data channel memory module). According to one embodiment, the multi-data channel memory module enables a plurality of independent sub-cache-block accesses to be serviced simultaneously. In addition, the memory architecture also supports cache-block accesses. For instance, multiple ones of the data channels may be employed for servicing a cache-block access. In one embodiment a DIMM architecture that comprises multiple data channels is provided. Each data channel supports a sub-cache-block access, and multiple ones of the data channels may be used for supporting a cache-block access. The plurality of data channels to a given DIMM may be used simultaneously to support different, independent memory access operations.

Abstract: A memory interleave system for providing memory interleave for a heterogeneous computing system is provided. The memory interleave system effectively interleaves memory that is accessed by heterogeneous compute elements in different ways, such as via cache-block accesses by certain compute elements and via non-cache-block accesses by certain other compute elements. The heterogeneous computing system may comprise one or more cache-block oriented compute elements and one or more non-cache-block oriented compute elements that share access to a common main memory. The cache-block oriented compute elements access the memory via cache-block accesses (e.g., 64 bytes, per access), while the non-cache-block oriented compute elements access memory via sub-cache-block accesses (e.g., 8 bytes, per access).

Abstract: A memory interleave system for providing memory interleave for a heterogeneous computing system is provided. The memory interleave system effectively interleaves memory that is accessed by heterogeneous compute elements in different ways, such as via cache-block accesses by certain compute elements and via non-cache-block accesses by certain other compute elements. The heterogeneous computing system may comprise one or more cache-block oriented compute elements and one or more non-cache-block oriented compute elements that share access to a common main memory. The cache-block oriented compute elements access the memory via cache-block accesses (e.g., 64 bytes, per access), while the non-cache-block oriented compute elements access memory via sub-cache-block accesses (e.g., 8 bytes, per access).