Patents by Inventor Jörg Bewersdorf
Jörg Bewersdorf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 7880149Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.Type: GrantFiled: June 29, 2010Date of Patent: February 1, 2011Assignees: The Jackson Laboratory, University of MaineInventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
-
Publication number: 20100283835Abstract: A method of performing 3D photoactivation microscope imaging includes providing a sample having a plurality of probes, each of the plurality of probes including a photo-activatable material. Probes from the plurality of probes are activated to form a sparse subset of probes, the sparse subset of probes having probes that are spatially separated by at least a microscope resolution. The sample is illuminated with a readout light source, and light emitted from activated probes is detected. Based on the light emission detected from the activated probes, localized three-dimensional positions of the activated probes are obtained.Type: ApplicationFiled: January 11, 2008Publication date: November 11, 2010Inventors: Joerg Bewersdorf, Michael Darin Mason, Sam T. Hess
-
Publication number: 20100265318Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.Type: ApplicationFiled: June 29, 2010Publication date: October 21, 2010Applicants: The Jackson Laboratory, University of MaineInventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
-
Patent number: 7772569Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.Type: GrantFiled: April 1, 2008Date of Patent: August 10, 2010Assignees: The Jackson Laboratory, University of MaineInventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
-
Patent number: 7742226Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: GrantFiled: July 20, 2006Date of Patent: June 22, 2010Assignee: Leica Microsystems CMS GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
-
Publication number: 20090242798Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.Type: ApplicationFiled: April 1, 2008Publication date: October 1, 2009Applicants: The Jackson Laboratory, University of MaineInventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
-
Patent number: 7333207Abstract: The invention relates to a confocal 4? microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.Type: GrantFiled: January 6, 2004Date of Patent: February 19, 2008Assignee: Leica Microsystems CMS GmbHInventors: Jörg Bewersdorf, Hilmar Gugel
-
Publication number: 20060291043Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: ApplicationFiled: July 20, 2006Publication date: December 28, 2006Applicant: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
-
Patent number: 7054062Abstract: The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.Type: GrantFiled: April 5, 2001Date of Patent: May 30, 2006Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Jörg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
-
Patent number: 6891670Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.Type: GrantFiled: February 6, 2002Date of Patent: May 10, 2005Assignee: Leica Microsystems Heidelberg GmbHInventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
-
Publication number: 20050078361Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: ApplicationFiled: August 17, 2004Publication date: April 14, 2005Applicant: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
-
Patent number: 6798569Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: GrantFiled: January 4, 2002Date of Patent: September 28, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel
-
Patent number: 6737635Abstract: The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.Type: GrantFiled: April 3, 2001Date of Patent: May 18, 2004Assignee: Leica Microsystems Heidelberg GmbHInventors: Johann Engelhardt, Juergen Hoffmann, Rafael Storz, Heinrich Ulrich, Joerg Bewersdorf, Holger Birk
-
Patent number: 6570705Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).Type: GrantFiled: September 18, 2001Date of Patent: May 27, 2003Assignee: Leica Microsystems Heidelberg GmbHInventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
-
Patent number: 6552795Abstract: A method and an apparatus for illuminating a transparent specimen (1), in particular for use in double confocal scanning microscopy, wherein for illumination of a point of the specimen (1), two light waves of a coherent light source (4) focused from opposite directions (2, 3) onto the point interfere to form an illumination pattern, and in order to eliminate the causes of the problems of the reconstruction method, at least two additional coherent light waves traveling toward one another are superimposed in order to minimize the secondary maxima (11, 12) of the illumination pattern.Type: GrantFiled: February 27, 2001Date of Patent: April 22, 2003Assignee: Leica Microsystems Heidelberg GmbHInventor: Joerg Bewersdorf
-
Publication number: 20020109913Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.Type: ApplicationFiled: February 6, 2002Publication date: August 15, 2002Inventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
-
Publication number: 20020105722Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4&pgr; microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.Type: ApplicationFiled: January 4, 2002Publication date: August 8, 2002Inventors: Joerg Bewersdorf, Hilmar Gugel
-
Publication number: 20020105723Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.Type: ApplicationFiled: January 4, 2002Publication date: August 8, 2002Inventors: Joerg Bewersdorf, Hilmar Gugel
-
Publication number: 20020034002Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).Type: ApplicationFiled: September 18, 2001Publication date: March 21, 2002Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbHInventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
-
Publication number: 20020030886Abstract: The present invention concerns a microscope having an illuminating beam path (1) of a light source (2), a detected beam path (3) of a detector (4), a component (5) combining the detected beam path (3), and at least two microscope objectives (7, 8) directed onto the specimen (6). In order to achieve enhanced detection efficiency, the present invention is characterized in that an optical component (14) arranged in the beam path (1, 3) has the property of acting on a portion of the illuminating and/or detected beam cross section in such a way that the combined detected light (15, 16) is guided in largely lossless fashion to the detector (4). Alternatively thereto, the microscope according to the present invention is characterized in that a polarizing beam splitter (19), arranged in the beam path (1, 3) and acting on the entirety of the illuminating and/or detected beam cross section, is provided.Type: ApplicationFiled: September 14, 2001Publication date: March 14, 2002Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbH.Inventors: Joerg Bewersdorf, Hilmar Gugel