Patents by Inventor Jörg Bewersdorf

Jörg Bewersdorf has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7880149
    Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: February 1, 2011
    Assignees: The Jackson Laboratory, University of Maine
    Inventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
  • Publication number: 20100283835
    Abstract: A method of performing 3D photoactivation microscope imaging includes providing a sample having a plurality of probes, each of the plurality of probes including a photo-activatable material. Probes from the plurality of probes are activated to form a sparse subset of probes, the sparse subset of probes having probes that are spatially separated by at least a microscope resolution. The sample is illuminated with a readout light source, and light emitted from activated probes is detected. Based on the light emission detected from the activated probes, localized three-dimensional positions of the activated probes are obtained.
    Type: Application
    Filed: January 11, 2008
    Publication date: November 11, 2010
    Inventors: Joerg Bewersdorf, Michael Darin Mason, Sam T. Hess
  • Publication number: 20100265318
    Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    Type: Application
    Filed: June 29, 2010
    Publication date: October 21, 2010
    Applicants: The Jackson Laboratory, University of Maine
    Inventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
  • Patent number: 7772569
    Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    Type: Grant
    Filed: April 1, 2008
    Date of Patent: August 10, 2010
    Assignees: The Jackson Laboratory, University of Maine
    Inventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
  • Patent number: 7742226
    Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
    Type: Grant
    Filed: July 20, 2006
    Date of Patent: June 22, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Publication number: 20090242798
    Abstract: A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    Type: Application
    Filed: April 1, 2008
    Publication date: October 1, 2009
    Applicants: The Jackson Laboratory, University of Maine
    Inventors: Joerg Bewersdorf, Manuel F. Juette, Travis Gould, Sam T. Hess
  • Patent number: 7333207
    Abstract: The invention relates to a confocal 4? microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.
    Type: Grant
    Filed: January 6, 2004
    Date of Patent: February 19, 2008
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Jörg Bewersdorf, Hilmar Gugel
  • Publication number: 20060291043
    Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4? microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
    Type: Application
    Filed: July 20, 2006
    Publication date: December 28, 2006
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Patent number: 7054062
    Abstract: The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.
    Type: Grant
    Filed: April 5, 2001
    Date of Patent: May 30, 2006
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Jörg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
  • Patent number: 6891670
    Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.
    Type: Grant
    Filed: February 6, 2002
    Date of Patent: May 10, 2005
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
  • Publication number: 20050078361
    Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
    Type: Application
    Filed: August 17, 2004
    Publication date: April 14, 2005
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Patent number: 6798569
    Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
    Type: Grant
    Filed: January 4, 2002
    Date of Patent: September 28, 2004
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Patent number: 6737635
    Abstract: The present invention concerns an apparatus for combining light from at least two laser light sources, preferably in the context of confocal scanning microscopy, and in order to make laser light sources of low output power usable as light sources, in particular for confocal scanning microscopy, is characterized in that the light from the laser light sources has at least approximately the same wavelength; and that at least one beam combining unit that combines the light beams in at least largely lossless fashion is provided.
    Type: Grant
    Filed: April 3, 2001
    Date of Patent: May 18, 2004
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Johann Engelhardt, Juergen Hoffmann, Rafael Storz, Heinrich Ulrich, Joerg Bewersdorf, Holger Birk
  • Patent number: 6570705
    Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).
    Type: Grant
    Filed: September 18, 2001
    Date of Patent: May 27, 2003
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
  • Patent number: 6552795
    Abstract: A method and an apparatus for illuminating a transparent specimen (1), in particular for use in double confocal scanning microscopy, wherein for illumination of a point of the specimen (1), two light waves of a coherent light source (4) focused from opposite directions (2, 3) onto the point interfere to form an illumination pattern, and in order to eliminate the causes of the problems of the reconstruction method, at least two additional coherent light waves traveling toward one another are superimposed in order to minimize the secondary maxima (11, 12) of the illumination pattern.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: April 22, 2003
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventor: Joerg Bewersdorf
  • Publication number: 20020109913
    Abstract: The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.
    Type: Application
    Filed: February 6, 2002
    Publication date: August 15, 2002
    Inventors: Hilmar Gugel, Joerg Bewersdorf, Stefan W. Hell
  • Publication number: 20020105722
    Abstract: The present invention concerns an interference microscope and a method for operating an interference microscope, in particular a 4&pgr; microscope, standing wave field microscope, or I2M, I3M, or I5M microscope, at least one specimen support unit associated with the specimen being provided. For determination of the phase position of the interfering light in the specimen region, on the basis of which the interference microscope can be aligned, the interference microscope is characterized in that for determination of the illumination state in the specimen region of the interference microscope, at least one planar area of the specimen support unit is configured to be detectable by light microscopy.
    Type: Application
    Filed: January 4, 2002
    Publication date: August 8, 2002
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Publication number: 20020105723
    Abstract: The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
    Type: Application
    Filed: January 4, 2002
    Publication date: August 8, 2002
    Inventors: Joerg Bewersdorf, Hilmar Gugel
  • Publication number: 20020034002
    Abstract: The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).
    Type: Application
    Filed: September 18, 2001
    Publication date: March 21, 2002
    Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbH
    Inventors: Joerg Bewersdorf, Hilmar Gugel, Juergen Hoffmann
  • Publication number: 20020030886
    Abstract: The present invention concerns a microscope having an illuminating beam path (1) of a light source (2), a detected beam path (3) of a detector (4), a component (5) combining the detected beam path (3), and at least two microscope objectives (7, 8) directed onto the specimen (6). In order to achieve enhanced detection efficiency, the present invention is characterized in that an optical component (14) arranged in the beam path (1, 3) has the property of acting on a portion of the illuminating and/or detected beam cross section in such a way that the combined detected light (15, 16) is guided in largely lossless fashion to the detector (4). Alternatively thereto, the microscope according to the present invention is characterized in that a polarizing beam splitter (19), arranged in the beam path (1, 3) and acting on the entirety of the illuminating and/or detected beam cross section, is provided.
    Type: Application
    Filed: September 14, 2001
    Publication date: March 14, 2002
    Applicant: LEICA MICROSYSTEMS HEIDELBERG GmbH.
    Inventors: Joerg Bewersdorf, Hilmar Gugel