Abstract: A position-measuring device is used to detect the relative position of two machine components that are disposed in a manner allowing movement relative to each other at least along a first and a second main direction of motion in a displacement plane. The device includes at least one measuring standard, which is mounted on a first machine component. At least six scanning units are mounted on a second machine component, and are used for the optical scanning of the measuring standard in at least two measuring directions in the displacement plane. At least two scanning units are assigned to each measuring direction. The scanning units of each respective measuring direction in the displacement plane are disposed non-centrosymmetrically in relation to a center of the second machine component.

Abstract: An interferometer includes a light source, a beam splitter, a measuring reflector, a reference retroreflector, a detector system, and two transparent plane plates. The beam splitter splits a first beam of rays, emitted by the light source, into at least one measuring beam and at least one reference beam, via which a first splitting plane is defined. The measuring beam propagates in a measuring arm and the reference beam propagates in a reference arm until being recombined at a recombining location in a first recombining plane. The first recombining plane is oriented parallel to the first splitting plane. The measuring reflector, on which the measuring beam falls perpendicularly at least twice, is disposed in the measuring arm and is joined to an object to be measured that is movable along a measuring direction. The reference retroreflector, on which the reference beam falls at least once, is disposed in the reference arm.

Abstract: In a system for detecting the position of an object in relation to a reference system, the object is arranged so as to be movable in relation to the reference system along at least two orthogonal first and second main movement axes. To record the position of the object in relation to the reference system, a position measuring device includes at least two two-dimensional measuring standards situated along the first main movement axis, and four scanning units for an optical scanning of these measuring standards. In addition, at least four additional supplementary scanning units are provided, which are situated between the four scanning units along the first main movement axis.

Abstract: An interferometer includes a light source and a beam splitter, via which the beam of rays emitted by the light source is split into a measurement beam and a reference beam. The measurement beam propagates in a measuring arm extending in a first direction between the beam splitter and a measuring reflector. The measuring reflector brings about an offset perpendicular to the direction of incidence between the measurement beam falling on it and the measurement beam reflected back by it. In a reference arm extending in a second direction, the reference beam propagates between the beam splitter and a reference reflector. In addition, the interferometer has a detector system, to which the superposed and recombined measurement beam and reference beam are able to be supplied, and via which a distance-dependent interference signal with respect to the position of the measuring reflector is able to be generated.

Abstract: An optical position measuring instrument including a first scale having a first graduation, wherein the first scale is disposed movable in a first measuring direction, and at a first defined position in the first measuring direction, the first scale includes a spatially limited first marking that differs from the first graduation. The optical position measuring instrument further including a second scale having a second graduation, wherein the second scale is disposed movable in a second measuring direction, and at a second defined position, the second scale includes a second reference marking that is usable for generating at least one reference signal at a reference position of the second scale only if the first scale is located in the first defined position.

Abstract: A position-measuring device is used to detect the relative position of two machine components that are disposed in a manner allowing movement relative to each other at least along a first and a second main direction of motion in a displacement plane. The device includes at least one measuring standard, which is mounted on a first machine component. At least six scanning units are mounted on a second machine component, and are used for the optical scanning of the measuring standard in at least two measuring directions in the displacement plane. At least two scanning units are assigned to each measuring direction. The scanning units of each respective measuring direction in the displacement plane are disposed non-centrosymmetrically in relation to a center of the second machine component.

Abstract: A position-measuring device, as well as a system having such a position-measuring device, is used for determining the position of a first object relative to a second object, the first and the second object being movable relative to one another along at least two measuring directions. The position-measuring device has an optical unit that is linked to one of the two objects and includes at least one light source, a detector system, as well as further optical elements in a defined configuration. In addition, the position-measuring device includes a measuring standard-reflector unit, which is provided on the other object, and has at least two differently formed regions in one track that are optically scannable by the optical unit for position sensing.

Abstract: A scale is attached to a carrier by optically contacting. The optically contacting bonds are formed by raised surface regions of the scale set apart from each other. Additional measures, such as the provision of adhesive surfaces, provide a rigid and vibration-resistant joint.

Abstract: A position-measuring system is for measuring the position of an object, movable in several degrees of freedom, relative to a stationary object. The position-measuring system includes at least one measuring graduation that is joined to one of the objects, as well as a plurality of scanning units which are joined to the other object and which generate raw position signals based on the optical scanning of the measuring graduation. Moreover, a multiplexer unit is provided, the raw position signals generated by the scanning units being supplied to the multiplexer unit, and from there, the raw position signals of the various scanning units being transmitted in time multiplex operation to a downstream sequential electronics, without converting the raw position signals into position values beforehand.

Abstract: A position-measuring device is for determining the position of two objects which are arranged displaceably with respect to each other in at least one measuring direction, and a method is for the operation of such a position-measuring device. The position-measuring device includes a measuring graduation as well as a scanning device having a light source and one or a plurality of optical and/or optoelectronic components for generating displacement-dependent position signals. A semiconductor laser having great coherence length is provided as the light source, which is operated pulsed in a single-mode operational-mode.

Abstract: A position-measuring system is for measuring the position of an object, movable in several degrees of freedom, relative to a stationary object. The position-measuring system includes at least one measuring graduation that is joined to one of the objects, as well as a plurality of scanning units which are joined to the other object and which generate raw position signals based on the optical scanning of the measuring graduation. Moreover, a multiplexer unit is provided, the raw position signals generated by the scanning units being supplied to the multiplexer unit, and from there, the raw position signals of the various scanning units being transmitted in time multiplex operation to a downstream sequential electronics, without converting the raw position signals into position values beforehand.

Abstract: A scale is attached to a carrier by optically contacting. The optically contacting bonds are formed by raised surface regions of the scale set apart from each other. Additional measures, such as the provision of adhesive surfaces, provide a rigid and vibration-resistant joint.

Abstract: A position-measuring device is for determining the position of two objects which are arranged displaceably with respect to each other in at least one measuring direction, and a method is for the operation of such a position-measuring device. The position-measuring device includes a measuring graduation as well as a scanning device having a light source and one or a plurality of optical and/or optoelectronic components for generating displacement-dependent position signals. A semiconductor laser having great coherence length is provided as the light source, which is operated pulsed in a single-mode operational-mode.

Abstract: A method for position determination that includes generating first and second position-dependent scanning signals, transmitting the first and second position-dependent scanning signals from a scanning location via corresponding first and second scanning channels to corresponding first and second storage elements, storing corresponding first and second instantaneous values present at the first and second storage elements at corresponding first and second storage times. Forming a measured position value from the first stored instantaneous value and the second stored instantaneous value. A difference exists between corresponding first and second transit times of the first and second position-dependent scanning signals in the corresponding first and second scanning channels, the difference is compensated by individually delaying the first and second position-dependent scanning signals, so that the stored first and second instantaneous values have appeared at a common time at the scanning location.

Abstract: A position measuring system for determining the relative position of two objects includes a power supply unit for generating a variable operating current for a laser light source. At least one photodetector generates position-dependent output signals from the light received from the laser light source. In measurement operation, the power supply unit provides a direct current having a superimposed alternating current component to the laser light source.

Abstract: A position measuring system that includes a scale and a scanning device that scans the scale. A light source, which emits a light pulse upon receipt of a request signal and an optical fiber that transmits the light pulse from the light source to the scanning device and for illuminating the scale. At least one photo detector that detects the light pulse affected by the scale as a function of its position.

Abstract: A method for position determination in a position measuring device that includes digitizing analog position data from a detector unit within time intervals of an internal clock rate and calculating position data from the digitized data. Determining a period of time ?t between a pulse of the internal clock until an appearance of an external trigger signal and a processing of at least two position data, together with the period of time ?t.

Abstract: An apparatus, in particular for simulating electrical sensor/actuator components, having a drive module (4), which provides a model (5, 6, 7) of the S/A component to be simulated and generates interface signals (U1n, Un) in accordance with the signals of the real S/A component to be simulated, and having a signal interface (12, 26) for each connection pin (28, 29) of the apparatus (1), which is driven by the real-time signals (8, 9, 10, 11) of the drive module (4) and generates, for each interface connection pin (28, 29), an interface signal (U1n, Un) corresponding to the electrical signals of the real S/A component, in which case the current direction or the energy flow of the interface signals (U1n, Un) can be directed, in a manner influenced by a control/regulation circuit of the signal interface (12, 26), towards the signal interface (12, 26) or away from the latter, with the result that the apparatus can optionally simulate a sensor or an actuator.