Patents by Inventor Jörg Eberlein

Jörg Eberlein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Add-drop device and cross-connect device for wavelength multiplex signals
    Patent number: 7356217
    Abstract: According to the invention, in add-drop devices of an optical cross-connect device for wavelength multiplex signals, tributary drop signals to be dropped are pre-selected in the drop branch by means of pre-selection elements. Only these signals are amplified, thus reducing the number and/or power of the optical amplifiers. The tributary drop signals are individually selected by means of drop routing elements and adjustable filters. The add branch is created correspondingly.
    Type: Grant
    Filed: February 18, 2004
    Date of Patent: April 8, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventors: Jörg Eberlein, Christian Eder, Alexander Richter, Robert Schimpe
  • Add-drop device and cross-connect device for wavelength multiplex signals
    Publication number: 20070160372
    Abstract: According to the invention, in add-drop devices of an optical cross-connect device for wavelength multiplex signals, tributary drop signals to be dropped are pre-selected in the drop branch by means of pre-selection elements. Only these signals are amplified, thus reducing the number and/or power of the optical amplifiers. The tributary drop signals are individually selected by means of drop routing elements and adjustable filters. The add branch is created correspondingly.
    Type: Application
    Filed: February 18, 2004
    Publication date: July 12, 2007
    Applicant: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Jörg Eberlein, Christian Eder, Alexander Richter, Robert Schimpe
  • Method for measuring the optical signal-to-noise ratios OSNR in a wavelength division multiplex (WDM) transmission system
    Patent number: 6847440
    Abstract: A method for measuring the optical signal-to-noise ratio in a Wavelength Division Multiplex (DWDM/WDM) transmission system is described in which the effect of the amplified spontaneous emission ASE differs through different components located in the transmission system such as various filters, for example. The measuring points of the signal and noise powers to measure the optical signal-to-noise ratio are selected in accordance with the spectral characteristics of these components by a network management system.
    Type: Grant
    Filed: June 26, 2003
    Date of Patent: January 25, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joerg Eberlein, Juergen Martin
  • Method for measuring the optical signal-to-noise ratios OSNR in a wavelength division multiplex (WDM) transmission system
    Publication number: 20040135993
    Abstract: A method for measuring the optical signal-to-noise ratio in a Wavelength Division Multiplex (DWDM/WDM) transmission system is described in which the effect of the amplified spontaneous emission ASE differs through different components located in the transmission system such as various filters, for example. The measuring points of the signal and noise powers to measure the optical signal-to-noise ratio are selected in accordance with the spectral characteristics of these components by a network management system.
    Type: Application
    Filed: June 26, 2003
    Publication date: July 15, 2004
    Inventors: Joerg Eberlein, Juergen Martin