Patents by Inventor Jörg Enderlein

Jörg Enderlein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10514533
    Abstract: A method for creating a microscope image of an object includes emitting excitation light, illuminating points on the object in a rastering manner, and detecting a raster partial image of a predetermined magnification for each illuminated point. An optical sensor detects emission light from the object excited by the excitation light. Distances between pairs of raster partial images correspond to distances of the illumination points multiplied by a correction factor. A microscopy device includes a light source, a rastering device, an optical sensor, and a deflecting device for deflecting the emission light. The deflecting device feeds excitation light passing through an inlet to the rastering device, light deflected at the rastering device to a first outlet, and emission light passing through the first outlet to the rastering device such that the emission light is deflected from the optical axis in the same direction as the excitation light.
    Type: Grant
    Filed: March 3, 2016
    Date of Patent: December 24, 2019
    Assignee: Georg-August-Universitaet Goettingen Stiftung Oeffentlichen Rechts
    Inventors: Joerg Enderlein, Ingo Gregor
  • Publication number: 20160246042
    Abstract: The invention relates to a method for creating a microscope image of at least part of an object, wherein the method comprises the following steps: a. emitting excitation light of an excitation wavelength Aex by means of a light source, b. illuminating a plurality of illumination points on the object with the excitation light in a rastering manner, which illumination points have a predetermined arrangement having predetermined distances between the illumination points, c.
    Type: Application
    Filed: March 3, 2016
    Publication date: August 25, 2016
    Inventors: Joerg Enderlein, Ingo Gregor
  • Patent number: 9111366
    Abstract: Statistical analysis techniques based on auto- and cross-correlations/cumulants, of image stacks of fluctuating objects are used to improve resolution beyond the classical diffraction limit and to reduce the background. The time trajectory of every pixel in the image frame is correlated with itself and/or with the time trajectory of an adjacent pixel. The amplitude of these auto- or cross-correlations/cumulants of each pixel, at a given time lag or averaged or integrated over an interval of time lags, is used as the intensity value of that pixel in the generated superresolved optical fluctuation image.
    Type: Grant
    Filed: September 9, 2013
    Date of Patent: August 18, 2015
    Assignee: Sofast GmbH
    Inventor: Joerg Enderlein
  • Publication number: 20140099043
    Abstract: Statistical analysis techniques based on auto- and cross-correlations/cumulants, of image stacks of fluctuating objects are used to improve resolution beyond the classical diffraction limit and to reduce the background. The time trajectory of every pixel in the image frame is correlated with itself and/or with the time trajectory of an adjacent pixel. The amplitude of these auto- or cross-correlations/cumulants of each pixel, at a given time lag or averaged or integrated over an interval of time lags, is used as the intensity value of that pixel in the generated superresolved optical fluctuation image.
    Type: Application
    Filed: September 9, 2013
    Publication date: April 10, 2014
    Applicant: SOFast GmbH
    Inventor: JOERG ENDERLEIN
  • Patent number: 8625863
    Abstract: Statistical analysis techniques based on auto- and cross-correlations/cumulants, of image stacks of fluctuating objects are used to improve resolution beyond the classical diffraction limit and to reduce the background. The time trajectory of every pixel in the image frame is correlated with itself and/or with the time trajectory of an adjacent pixel. The amplitude of these auto- or cross-correlations/cumulants of each pixel, at a given time lag or averaged or integrated over an interval of time lags, is used as the intensity value of that pixel in the generated superresolved optical fluctuation image.
    Type: Grant
    Filed: June 2, 2010
    Date of Patent: January 7, 2014
    Assignee: Sofast GmbH
    Inventor: Joerg Enderlein
  • Publication number: 20100303386
    Abstract: Statistical analysis techniques based on auto- and cross-correlations/cumulants, of image stacks of fluctuating objects are used to improve resolution beyond the classical diffraction limit and to reduce the background. The time trajectory of every pixel in the image frame is correlated with itself and/or with the time trajectory of an adjacent pixel. The amplitude of these auto- or cross-correlations/cumulants of each pixel, at a given time lag or averaged or integrated over an interval of time lags, is used as the intensity value of that pixel in the generated superresolved optical fluctuation image.
    Type: Application
    Filed: June 2, 2010
    Publication date: December 2, 2010
    Inventor: Joerg ENDERLEIN
  • Patent number: 7817269
    Abstract: According to the invention, an excitation layer is focused into a sample and switched on suddenly in order to improve the microscopic resolution; the history of the resulting fluorescence transient is detected and imperatively depending on the excitation intensity, wherein different patterns for the history of different transients are determined for individual excitation intensity values and are matched with the measured transient and the amplitude of the pattern matching the excitation power in the focus is determined and used as a pixel value and the sample scanned in this manner, whereby the spatial resolution is improved to levels lying below the Abbe limit by evaluating the transient.
    Type: Grant
    Filed: April 28, 2006
    Date of Patent: October 19, 2010
    Assignee: PicoQuant GmbH
    Inventor: Jörg Enderlein