Abstract: The present invention relates to a measurement light source for generating measurement light with a uniform spatial illumination intensity distribution. The measurement light source comprises a solid block, in which an illumination space, a light-forming space and a light exit space are each formed as a hollow space in the block and have a diffusely reflecting inner surface. The illumination space opens into the light-forming space. The light-forming space opens into the light exit space. At least one light source is at least partially arranged in the illumination space in order to generate light. The light exit space has a light exit. According to the invention, an axis of the illumination space and an axis of the light exit space are arranged at a distance from one another. The light-forming space is designed for a reversal of a light propagation direction. The invention also relates to a measuring arrangement for detecting at least an absolute reflection spectrum of a sample.

Abstract: The present invention relates to a measurement light source for generating measurement light with a uniform spatial illumination intensity distribution. The measurement light source comprises a solid block, in which an illumination space, a light-forming space and a light exit space are each formed as a hollow space in the block and have a diffusely reflecting inner surface. The illumination space opens into the light-forming space. The light-forming space opens into the light exit space. At least one light source is at least partially arranged in the illumination space in order to generate light. The light exit space has a light exit. According to the invention, an axis of the illumination space and an axis of the light exit space are arranged at a distance from one another. The light-forming space is designed for a reversal of a light propagation direction. The invention also relates to a measuring arrangement for detecting at least an absolute reflection spectrum of a sample.

Abstract: A measurement arrangement for measuring diffusely reflected light and specularly includes a measurement light source for generating measurement light, an optical receiver for receiving measurement light, and a first mirror for reflecting the measurement light emerging from the measurement light source. The measurement arrangement additionally comprises a second mirror for reflecting diffusely reflected measurement light to the optical receiver. A settable third mirror is also provided, which in a first position is aligned for directing the measurement light that was directed onto a sample by the first mirror and specularly reflected by the sample to the optical receiver. The third mirror in a second position releases a beam path between the second mirror and the optical receiver, so that the measurement light directed onto the sample by the first mirror and diffusely reflected by the sample to the second mirror is directed to the optical receiver by the second mirror.

Abstract: A measuring light source includes a hollow body having a diffusely reflective inner surface. Formed in the hollow body are a concave, concave mirror-shaped illumination space, a tubular light shaping space, and a concave, concave mirror-shaped light exit space, which have a shared axis. A light source for generating light is at least partially situated in the illumination space. The light exit space has a light exit. The illumination space and the light exit space with their concave mirror shapes are situated opposite one another and are connected by the tubular light shaping space. A diffusely reflecting reflective disk for reflecting the light, reflected from the inner surface of the hollow body situated in the light exit space, through the light exit to outside the hollow body is situated in the hollow body.

Abstract: The invention relates to a measuring arrangement for detecting an absolute reflection spectrum of a sample in a process for producing the sample. It comprises a light source for generating measurement light, a homogenizer for generating a uniform spatial illuminance distribution of the measurement light; a movable reflector and a receiver for collecting the measurement light reflected from the sample and/or the reflector. According to the invention, the reflector both for a reference measurement and for a sample measurement is positioned in an observation beam path and arranged on the same side of the sample as the light source in order to feed the reflected measurement light to the receiver.

Abstract: A measuring light source includes a hollow body having a diffusely reflective inner surface. Formed in the hollow body are a concave, concave mirror-shaped illumination space, a tubular light shaping space, and a concave, concave mirror-shaped light exit space, which have a shared axis. A light source for generating light is at least partially situated in the illumination space. The light exit space has a light exit. The illumination space and the light exit space with their concave mirror shapes are situated opposite one another and are connected by the tubular light shaping space. A diffusely reflecting reflective disk for reflecting the light, reflected from the inner surface of the hollow body situated in the light exit space, through the light exit to outside the hollow body is situated in the hollow body.

Abstract: The invention relates to a measuring arrangement for detecting an absolute reflection spectrum of a sample in a process for producing the sample. It comprises a light source for generating measurement light, a homogenizer for generating a uniform spatial illuminance distribution of the measurement light; a movable reflector and a receiver for collecting the measurement light reflected from the sample and/or the reflector. According to the invention, the reflector both for a reference measurement and for a sample measurement is positioned in an observation beam path and arranged on the same side of the sample as the light source in order to feed the reflected measurement light to the receiver.

Abstract: The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates.

Abstract: A device includes a hollow body having a light-exit opening configured to illuminate a specimen, an interior of the hollow body comprising a diffusely scattering layer. The device also includes a light source configured to illuminate the diffusely scattering layer, a first photo-detector aligned along a first detection axis, and a second photo-detector aligned along a second detection axis. The device is configured to measure referenced measurements of reflected light.

Abstract: A measurement device for spectroscopic examination of samples comprises a cavity extending in a longitudinal direction, a first opening to face a sample, a plurality of second openings for capturing light originating from the sample and at least one third opening for coupling light into the cavity. Such a measurement device is particularly suitable for spectroscopic examinations of planar samples.

Abstract: The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates.

Abstract: A device for referenced measurement of reflected light and a method for calibrating such a device are disclosed.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.