Patents by Inventor Jörg Wiesmann

Jörg Wiesmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive x-ray spectrometric devices
    Patent number: 7113567
    Abstract: In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair comprises carbon or scandium and the other comprises a metal oxide or a metal nitride and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.
    Type: Grant
    Filed: July 17, 2002
    Date of Patent: September 26, 2006
    Assignee: GKSS Forschungszentrum Geesthacht
    Inventors: Carsten Michaelsen, Rüdiger Bormann, Jörg Wiesmann
  • Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive X-ray spectrometric devices
    Patent number: 6650728
    Abstract: In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair consists of lanthanum and the other consists of carbon and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.
    Type: Grant
    Filed: July 17, 2002
    Date of Patent: November 18, 2003
    Assignee: Forschungszentrum Geesthacht
    Inventors: Carsten Michaelsen, Rudiger Bormann, Jörg Wiesmann
  • Product having a substrate of a partially stabilized zirconium oxide and a buffer layer of a fully stabilized zirconium oxide, and process for its production
    Patent number: 6258472
    Abstract: The invention relates to a product having a substrate of a partially stabilized zirconium oxide and a buffer layer of a fully stabilized zirconium oxide. In this case, the substrate is untextured and the buffer layer is biaxially textured and joined to the substrate via an interlayer which consists is made of a material that is different than zirconium oxide but is compatible with the latter. This product is in particular produced with ion beam-assisted deposition of the buffer layer. It is suitable in particular as a support for a functional layer of a ceramic superconductor, e.g. for use as a superconducting current limiter.
    Type: Grant
    Filed: June 18, 1999
    Date of Patent: July 10, 2001
    Assignee: Siemens Aktiengesellschaft
    Inventors: Heinz-Werner Neumüller, Wolfgang Schmidt, Klaus Heinemann, Jörg Wiesmann, Jörg Hoffmann, Jürgen Dzick, Herbert-Carl Freyhardt