Patents by Inventor Jürgen Eser

Jürgen Eser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9064740
    Abstract: In vapor deposition applications, especially OLED mass production, where it is necessary to measure and/or control the deposition rate of evaporation sources within specific tolerances, a measurement system is adapted to use robust and accurate optical thickness measurement methods at high and low rate sources, so that the thickness of a layer deposited on a substrate can be measured and controlled. A first evaporation source (11) deposits a layer of material on a substrate (20). A mobile element (41) is provided, On which a film is deposited from a second evaporation source (12b) in a deposition location (D1). Subsequently the mobile element is conveyed to a measurement location (D2) where the thickness of the film is measured by a thickness detector (45). The measurement apparatus is arranged to control the deposition of the first evaporation source in dependence on the thickness of the film deposited on the mobile element.
    Type: Grant
    Filed: April 16, 2012
    Date of Patent: June 23, 2015
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Johannes Krijne, Jürgen Eser
  • Publication number: 20140186974
    Abstract: In vapour deposition applications, especially OLED mass production, where it is necessary to measure and/or control the deposition rate of evaporation sources within specific tolerances, a measurement system is adapted to use robust and accurate optical thickness measurement methods at high and low rate sources, so that the thickness of a layer deposited on a substrate can be measured and controlled. A first evaporation source (11) deposits a layer of material on a substrate (20). A mobile element (41) is provided, On which a film is deposited from a second evaporation source (12b) in a deposition location (D1). Subsequently the mobile element is conveyed to a measurement location (D2) where the thickness of the film is measured by a thickness detector (45). The measurement apparatus is arranged to control the deposition of the first evaporation source in dependence on the thickness of the film deposited on the mobile element.
    Type: Application
    Filed: April 16, 2012
    Publication date: July 3, 2014
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: Johannes Krijne, Jürgen Eser
  • Patent number: 8179036
    Abstract: A light emitting device includes a stack of layers having a basic layer, a first electrode layer and a second electrode layer. An organic light-emitting layer is sandwiched between the first and second electrode layers. At least one shunt element has a connection-end and a free-end. The connection-end is connected with one of the electrode layers, and the free-end is jutting out of the stack of layers.
    Type: Grant
    Filed: January 17, 2008
    Date of Patent: May 15, 2012
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Juergen Eser, Edward Willem Albert Young, Johannes Krijne, Arie Van Der Van Der Padt
  • Publication number: 20100109513
    Abstract: The invention relates to a light emitting device (10), comprising a stack of layers (15) comprising a basic layer (20), a first electrode layer (30) and a second electrode layer (40), wherein an organic light-emitting layer (50) is sandwiched between the first (30) and the second electrode layer (40), with at least one shunt element (60,60?), comprising a connection-end (65) and a free-end (66), wherein the connection-end (65) is connected with one of the electrode layers (30,40), and wherein the free-end (66) is jutting out of the stack of layers (15). The invention further relates to a method to manufacture such a device.
    Type: Application
    Filed: January 17, 2008
    Publication date: May 6, 2010
    Applicant: Koninklijke Philips Electronics N.V.
    Inventors: Juergen Eser, Edward Willem Albert Young, Johannes Krijne, Arie Van Der Van Der Padt