Patents by Inventor Jürgen Ettmüller

Jürgen Ettmüller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10837898
    Abstract: Described herein is a sensor for a virtually simultaneous measurement of transmission and/or forward scattering and/or remission and for a simultaneous measurement of the transmission and forward scattering or the transmission and remission of a liquid sample. Further described herein is a method for a virtually simultaneous measurement of transmission and/or forward scattering and/or remission and for a simultaneous measurement of the transmission and forward scattering or the transmission and remission of a liquid sample using a sensor according to the invention. Further described herein is a method for using the sensor according to the invention in order to determine the color properties of painting agents such as lacquers, dyes, pastes, and pigments or dilutions thereof.
    Type: Grant
    Filed: September 7, 2017
    Date of Patent: November 17, 2020
    Assignee: BASF COATINGS GMBH
    Inventors: Andreas Joch, Michael Schaefer, Carlos Arthur Leaes Peixoto, Juergen Ettmueller, Stefan Ziegler, Pieter Moonen
  • Publication number: 20190212256
    Abstract: Described herein is a sensor for a virtually simultaneous measurement of transmission and/or forward scattering and/or remission and for a simultaneous measurement of the transmission and forward scattering or the transmission and remission of a liquid sample. Further described herein is a method for a virtually simultaneous measurement of transmission and/or forward scattering and/or remission and for a simultaneous measurement of the transmission and forward scattering or the transmission and remission of a liquid sample using a sensor according to the invention. Further described herein is a method for using the sensor according to the invention in order to determine the color properties of painting agents such as lacquers, dyes, pastes, and pigments or dilutions thereof.
    Type: Application
    Filed: September 7, 2017
    Publication date: July 11, 2019
    Inventors: Andreas Joch, Michael Schaefer, Carlos Arthur Leaes Peixoto, Juergen Ettmueller, Stefan Ziegler, Pieter Moonen
  • Patent number: 8121388
    Abstract: A method for automated determination of an individual three-dimensional shape of particles includes: a) dosing, alignment, and automated delivery of the particles; b) observation of the aligned particles and image acquisition, and c) evaluation of the images. A device for automated determination of the individual three-dimensional shape of particles includes: a) a mechanism for dosing, alignment, and automated delivery of the particles; b) at least two cameras for observation of the aligned particles, and c) a mechanism for evaluation of the images. The device can be used for automated determination of individual three-dimensional shape of particles.
    Type: Grant
    Filed: November 16, 2006
    Date of Patent: February 21, 2012
    Assignee: BASF Aktiengesellschaft
    Inventors: Michael Schaefer, Juergen Ettmueller, Stefan Ziegler, Klaus Reindel
  • Patent number: 7821641
    Abstract: A three-dimensional flow cell for aligning non-isometric particles in a liquid sample in two axes, a method of aligning non-isometric particles in a liquid sample, the use of the three-dimensional flow cell, a reflectance sensor which has the three-dimensional flow cell according to the invention, a method of measuring the reflectance of a liquid sample containing non-isometric particles and the use of the reflectance sensor according to the invention.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: October 26, 2010
    Assignee: BASF Corporation
    Inventors: Beate Wagner, Jürgen Ettmüller, Michael Schäfer, Jürgen Lohmann, Jan Berg, Andreas Daiss
  • Patent number: 7602497
    Abstract: The invention relates to reflectance sensors built up from an optical unit, a sample analysis unit and a system control unit, and to a method of measuring the reflectance of a sample in the form of a liquid pigment preparation, and to the use of a reflectance sensor according to the invention for the measurement of the reflectance of liquid pigment preparations in various process stages during the production, further processing and use of the liquid pigment preparations.
    Type: Grant
    Filed: July 1, 2004
    Date of Patent: October 13, 2009
    Assignee: BASF Coatings AG
    Inventors: Jan Berg, Jürgen Lohmann, Michael Schäfer, Jürgen Ettmüller
  • Patent number: 7009186
    Abstract: In a method for monitoring of polymer in a liquid state, such as a polymer melt or resin, to detect inhomogeneities therein, such as the presence of other phase objects, especially gels in a matrix formed of the liquid state, the polymer in a liquid state flowing past an inspection point is monitored. At the inspection point, electromagnetic radiation in the form of UV light or polarised electromagnetic radiation is passed through the flow chamber (1) and received by a detector (8), and the absorption of the UV light or the changes in the state of polarisation of the electromagnetic radiation caused by the inhomogeneities are used to observe them.
    Type: Grant
    Filed: January 3, 2002
    Date of Patent: March 7, 2006
    Assignee: Valtion Teknillinen Tutkimuskeskus
    Inventors: Janusz Sadowski, Jyrki Salminen, Peter Huber, Camie Heffels, Marian Mours, Klaus Reindel, Jürgen Ettmüller
  • Patent number: 6674529
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: January 6, 2004
    Assignee: BASF Aktiengesellschaft
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Rädle, Helmut Biermann, Hans Jürgen Eisen, Jürgen Ettmüller, Johannes G Reuvers
  • Patent number: 6535283
    Abstract: The disclosure is a probelike apparatus (16) for spectroscopic analysis of a fluid medium (19) by attenuated reflection. Two light beams from a light source (11) impinge upon the boundary (18) between a prism (17) and the medium (19) to be analyzed and the intensities of the light beams reflected at the boundary are measured in a detector unit (22). The two light beams differ in their angle of incidence on the boundary and/or in their polarization state. Measurement is preferably carried out under total reflection.
    Type: Grant
    Filed: December 3, 1999
    Date of Patent: March 18, 2003
    Assignee: BASF Aktiengesellschaft
    Inventors: Camiel Heffels, Thomas Beuermann, Matthias Rädle, Benno Sens, Alfred Rennig, Jürgen Ettmüller