Abstract: A method and a circuit functionally test a semiconductor component. The functional test is performed with galvanic isolation by using a transformer. The test itself is based on determining the frequency-dependent impedance of a series circuit of capacitors and inductors using the semiconductor component itself. The impedance is strongly influenced by the conduction state of the semiconductor component, in other words, by the instantaneous conductivity or blocking capability of the semiconductor component.

Abstract: The invention provides a device and method for wireless transmission of energy. An electromagnetic field used for transmitting energy is generated using a resonator system comprising a plurality of weakly coupled resonators, the resonator system having a plurality of eigenmodes with different eigenfrequencies. At least one generator is coupled to one of the resonators. The resonator is configured to operate the resonator system at one of the plurality of eigenmodes, thereby generating a spatially coherent magnetic field adapted for transmitting energy to an appliance.

Abstract: A switch load shedding device for a disconnect switch may be used in electric vehicles. The disconnect switch must perform a galvanic disconnect between the battery and the intermediate circuit. To this end, at least one semiconductor switch is used. The current to be switched off is conducted via the semiconductor switch for disconnecting the electric connection. The disconnect switch is previously or subsequently switched off under reduced voltage buildup.

Abstract: A method and a circuit functionally test a semiconductor component. The functional test is performed with galvanic isolation by using a transformer. The test itself is based on determining the frequency-dependent impedance of a series circuit of capacitors and inductors using the semiconductor component itself. The impedance is strongly influenced by the conduction state of the semiconductor component, in other words, by the instantaneous conductivity or blocking capability of the semiconductor component.