Patents by Inventor Jörn Maeritz

Jörn Maeritz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7348187
    Abstract: In the case of the method, an analysis is performed by using values of at least one process parameter of the manufacturing process of the physical object and, as a result of the analysis, when they satisfy a prescribed selection criterion, physical objects are marked in such a way that the associated physical objects can be taken as a random sample for the monitoring of the manufacturing process.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: March 25, 2008
    Assignee: Infineon Technologies AG
    Inventor: Jörn Maeritz
  • Patent number: 7027943
    Abstract: In the case of the method for the computer-aided monitoring of process parameters of a manufacturing process of a physical object, object data which identify the physical object are assigned to various hierarchical levels, object data of various hierarchical levels are grouped to form hierarchical object data records, limit values for at least one process parameter are stored and respectively assigned to a hierarchical object data record, process data of the at least one process parameter, measured during the manufacture of physical objects, are stored and the hierarchical object data records corresponding to the object data are determined for physical objects manufactured.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: April 11, 2006
    Assignee: Infineon Technologies AG
    Inventors: Erwin Steinkirchner, Jörn Maeritz
  • Patent number: 7016750
    Abstract: In the case of a method for monitoring of a manufacturing process of a plurality of physical objects, several rules which relate to at least one status of at least one of the plurality of physical objects are stored. Furthermore, in the case of the method, a sample is selected from the plurality of physical objects by using the several rules, with physical objects of the sample being marked in such a way that they can be subjected to a measurement, the rules being formed on the basis of the criterion that the number of measurements is reduced and redundant measurements are avoided, and it being possible in the case of the method for the several rules to be combined with one another and checked against one another.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: March 21, 2006
    Assignee: Infineon Technologies AG
    Inventors: Erwin Steinkirchner, Jörn Maeritz
  • Patent number: 6909933
    Abstract: In the case of a method for the computer-aided monitoring and controlling of a manufacturing process of a plurality of physical objects, the physical objects are subjected to at least one manufacturing step and at least one of the processed physical objects is marked according to a deterministic selection criterion in such a way that it can be subjected to a test measurement. Furthermore, the manufacturing process is controlled on the basis of the result of the test measurement of the marked object.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: June 21, 2005
    Assignee: Infineon Technologies AG
    Inventor: Jörn Maeritz