Abstract: A Light Detection and Ranging (LIDAR) system includes a LIDAR transmitter and a controller. The LIDAR transmitter, driven by the controller, scans a field of view with laser beams, where each laser beam has a beam width that, when projected into a field of view, coincides with an angle region of the field of view. The LIDAR transmitter transmits a first plurality of laser beams in a first scan, where a first plurality of angle regions covered by the first plurality of laser beams are mutually exclusive of each other. The LIDAR transmitter transmits a second plurality of laser beams in a second scan, where a second plurality of angle regions covered by the second plurality of laser beams are mutually exclusive of each other. Each of the second plurality of angle regions partially overlaps with a different corresponding one of the first plurality of angle regions.

Abstract: An apparatus for light detection and ranging is provided. The apparatus includes a reflective surface configured to oscillate about a rotation axis, and a plurality of light sources each configured to controllably emit a respective light beam via an optical system onto the reflective surface. Further, the apparatus includes a controller configured to control emission times of the plurality of light sources so that the reflective surface emits a plurality of light beams to an environment according to a first sequence of beam directions for a first measurement, and according to a second sequence of beam directions for a subsequent second measurement.

Abstract: A method of monitoring a microelectromechanical systems (MEMS) oscillating structure includes: driving the MEMS oscillating structure configured to oscillate about a rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, wherein the MEMS oscillating structure is a non-linear resonator; inducing an oscillation decay of the MEMS oscillating structure at predefined tilt angle such that an oscillation of the MEMS oscillating structure decays from the predefined tilt angle over a decay period; measuring at least one characteristic of the oscillation decay; and determining a mechanical health of the MEMS oscillating structure based on the at least one characteristic of the oscillation decay.

Abstract: A method of monitoring a microelectromechanical systems (MEMS) oscillating structure includes: driving the MEMS oscillating structure configured to oscillate about a rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, wherein the MEMS oscillating structure is a non-linear resonator; inducing an oscillation decay of the MEMS oscillating structure at predefined tilt angle such that an oscillation of the MEMS oscillating structure decays from the predefined tilt angle over a decay period; measuring at least one characteristic of the oscillation decay; and determining a mechanical health of the MEMS oscillating structure based on the at least one characteristic of the oscillation decay.

Abstract: Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.

Abstract: Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.

Abstract: A Light Detection and Ranging (LIDAR) system includes a LIDAR transmitter and a controller. The LIDAR transmitter, driven by the controller, scans a field of view with laser beams, where each laser beam has a beam width that, when projected into a field of view, coincides with an angle region of the field of view. The LIDAR transmitter transmits a first plurality of laser beams in a first scan, where a first plurality of angle regions covered by the first plurality of laser beams are mutually exclusive of each other. The LIDAR transmitter transmits a second plurality of laser beams in a second scan, where a second plurality of angle regions covered by the second plurality of laser beams are mutually exclusive of each other. Each of the second plurality of angle regions partially overlaps with a different corresponding one of the first plurality of angle regions.

Abstract: Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.

Abstract: Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.

Abstract: A method performed by a Lidar detection system includes operating a 2D pixel array of pixel sensors of a detector device to detect an object in a target area of a scanner device, where the scanner device is to scan the target area by emitting a laser light toward the target area; identifying a position of the scanner device when the scanner device is scanning the target area; selecting a portion of the pixel sensors of the 2D pixel array for reading depending on the position of the scanner device to detect the object, where the portion of the pixel sensors are to detect the object by sensing the laser light reflecting from the object; and determining a characteristic of the object based on measurements of the portion of the pixel sensors of the 2D pixel array, where the measurements correspond to the laser light reflecting from the object.

Abstract: An apparatus for light detection and ranging is provided. The apparatus includes a reflective surface configured to oscillate about a rotation axis, and a plurality of light sources each configured to controllably emit a respective light beam via an optical system onto the reflective surface. Further, the apparatus includes a controller configured to control emission times of the plurality of light sources so that the reflective surface emits a plurality of light beams to an environment according to a first sequence of beam directions for a first measurement, and according to a second sequence of beam directions for a subsequent second measurement.