Patents by Inventor Jabez J. McClelland

Jabez J. McClelland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8680482
    Abstract: A method for aligning the axis of an atom beam with the orientation of an electric field at a particular location within an enclosure for use in creating a charged particle source by photoionizing a cold atom beam. The method includes providing an atom beam in the enclosure, providing a plurality of electrically conductive devices in said enclosure, evacuating the enclosure to a pressure below about 10?6 millibar, and aligning the axis of the atom beam with the orientation of the electric field, relative to each other, within less than about two degrees. Alignment may be facilitated by applying at least one voltage to the electrically conductive devices, mechanically tilting the atom beam's axis orientation of the electric field relative to each other and/or causing a deflection of the atom beam.
    Type: Grant
    Filed: August 8, 2013
    Date of Patent: March 25, 2014
    Assignee: The United States of America, as represented by the Secretary of Commerce, NIST
    Inventors: Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
  • Patent number: 8530853
    Abstract: A system for producing a charged particle beam from a photoionized cold atom beam. A vapor of neutral atoms is generated. From these atoms, an atom beam having axial and transverse velocity distributions controlled by the application of laser light is produced. The produced atom beam is spatially compressed along each transverse axis, thus reducing the cross-sectional area of the produced beam and reducing a velocity spread of the produced beam along directions transverse to the beam's direction of propagation. Laser light is directed onto at least a portion of the neutral atoms in the atom beam, thereby producing ions and electrons. An electric field is generated at the location of the produced ions and electrons, thereby producing a beam of ions traveling in a first direction and electrons traveling in substantially the opposite direction. A vacuum chamber contains the atom beam, the ion beam and the electron beam.
    Type: Grant
    Filed: February 8, 2012
    Date of Patent: September 10, 2013
    Assignee: The United States of America, as represented by the Secretary of Commerce, NIST
    Inventors: Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland
  • Patent number: 8350556
    Abstract: An integrated optical element and Faraday cup that can measure charged particle beam currents, manipulate light and analyze charged particle beam energy distribution. One boundary of the cup is formed by a lens or other suitable optical element which can be used for manipulating light along the axis of the Faraday cup. The surface of the optical element interior to the cup is coated with a transparent conductor in order to establish the simultaneous functions of taking charged particle beam current measurements, taking energy distribution measurements and manipulating light for such applications as focusing or imaging. A suppressor/blanker/retarder electrode is designed to eliminate spurious current signals that can result from production of secondary electrons by the charged particle beam impinging on the electrode surface.
    Type: Grant
    Filed: January 21, 2010
    Date of Patent: January 8, 2013
    Assignee: The United States of America as represented by the Secretary of Commerce, NIST
    Inventors: Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
  • Publication number: 20120145919
    Abstract: A system for producing a charged particle beam from a photoionized cold atom beam. A vapor of neutral atoms is generated. From these atoms, an atom beam having axial and transverse velocity distributions controlled by the application of laser light is produced. The produced atom beam is spatially compressed along each transverse axis, thus reducing the cross-sectional area of the produced beam and reducing a velocity spread of the produced beam along directions transverse to the beam's direction of propagation. Laser light is directed onto at least a portion of the neutral atoms in the atom beam, thereby producing ions and electrons. An electric field is generated at the location of the produced ions and electrons, thereby producing a beam of ions traveling in a first direction and electrons traveling in substantially the opposite direction. A vacuum chamber contains the atom beam, the ion beam and the electron beam.
    Type: Application
    Filed: February 8, 2012
    Publication date: June 14, 2012
    Inventors: Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland
  • Publication number: 20120027946
    Abstract: A method and apparatus for depositing and removing nanoscale conductors. A magneto-optical trap ion source (MOTIS) creates a beam of focused metal ions that either deposit directly at low energy (<0.5 keV) or sputter material away at high energy (>2 keV). By scanning the beam, layers of material may be built up into a desired pattern. By employing a MOTIS as the source of ions for the beam, and then directing that beam through an appropriate ion-optical column, isotopically pure samples may be deposited into patterns with nanoscale feature sizes. The ability to quickly remove material, and deposit isotopically pure metals is desirable, for instance, during the circuit edit stage of integrated circuit manufacture.
    Type: Application
    Filed: October 4, 2011
    Publication date: February 2, 2012
    Inventors: Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland
  • Publication number: 20110210264
    Abstract: An ion beam system uses a separate accelerating electrode, such as a resistive tube, to accelerate the ions while maintaining a low electric field at an extended, that is, distributed ion source, thereby improving resolution. A magneto-optical trap can be used as the ion source.
    Type: Application
    Filed: September 20, 2010
    Publication date: September 1, 2011
    Applicants: FEI COMPANY, Standard
    Inventors: Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele, Jonathan H. Orloff
  • Publication number: 20100141236
    Abstract: An integrated optical element and Faraday cup that can measure charged particle beam currents, manipulate light and analyze charged particle beam energy distribution. One boundary of the cup is formed by a lens or other suitable optical element which can be used for manipulating light along the axis of the Faraday cup. The surface of the optical element interior to the cup is coated with a transparent conductor in order to establish the simultaneous functions of taking charged particle beam current measurements, taking energy distribution measurements and manipulating light for such applications as focusing or imaging. A suppressor/blanker/retarder electrode is designed to eliminate spurious current signals that can result from production of secondary electrons by the charged particle beam impinging on the electrode surface.
    Type: Application
    Filed: January 21, 2010
    Publication date: June 10, 2010
    Inventors: Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
  • Patent number: 7709807
    Abstract: A system and method are disclosed for producing a source of ions, and particularly, a focused ion beam. The system and method use a magneto-optical trap (MOT) to produce a population of neutral atoms. A laser is then utilized to ionize atoms and produce a population of ions. An extraction element is then used to transfer the ions so that they can be used in a wide array of applications.
    Type: Grant
    Filed: May 7, 2008
    Date of Patent: May 4, 2010
    Assignee: United States of America as represented by the Secretary of Commerce, The National Institute of Standards and Technology
    Inventors: Jabez J. McClelland, James L. Hanssen, Marcus Jacka, Shannon B. Hill
  • Publication number: 20080296483
    Abstract: A system and method are disclosed for producing a source of ions, and particularly, a focused ion beam. The system and method use a magneto-optical trap (MOT) to produce a population of neutral atoms. A laser is then utilized to ionize atoms and produce a population of ions. An extraction element is then used to transfer the ions so that they can be used in a wide array of applications.
    Type: Application
    Filed: May 7, 2008
    Publication date: December 4, 2008
    Applicant: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
    Inventors: Jabez J. McClelland, James L. Hanssen, Marcus Jacka, Shannon B. Hill
  • Patent number: 6165688
    Abstract: A metastable depassivation lithography process for fabricating microstructures on a surface which utilizes the energy contained in neutral metastable rare gas atoms to remove passivating atoms from selected areas of a surface. Removal of the passivating atoms in a pattern allows further chemical processing to add or remove material to the exposed areas. The neutral metastable rare gas atoms can be directed to the surface using atom optical techniques to effect a desired pattern of exposure by the atoms. Alternatively, a mask can be used to effect a desired pattern of exposure.
    Type: Grant
    Filed: May 12, 1997
    Date of Patent: December 26, 2000
    Assignee: The United States of America, as represented by the Secretary of Commerce
    Inventors: Robert J. Celotta, Jabez J. McClelland, Rajeev Gupta, Harold Craighead
  • Patent number: 5360764
    Abstract: A method of depositing atoms on a substrate in which a beam of atoms is optically focused utilizing a laser beam. The laser beam is used to form a standing wave above the surface of a substrate. As the beam of atoms is passed through the standing wave, the atoms are focused by dipole force interactions. The deposition of atoms is focused into parallel lines which coincide with the minima of the standing wave. The use of two standing waves allows for focusing the atoms into discrete dots or spots. Relative movement between the substrate and the standing wave(s) allows for depositing atoms in a scanning manner. Various nanostructures can be made by the disclosed method.
    Type: Grant
    Filed: February 16, 1993
    Date of Patent: November 1, 1994
    Assignee: The United States of America, as represented by the Secretary of Commerce
    Inventors: Robert J. Celotta, Jabez J. McClelland