Abstract: An integrated circuit (IC) includes: a storage having a storage interface and addressable bytes, the storage interface coupled to first and second sets of peripheral terminals; control circuitry having control circuitry inputs and control circuitry outputs, the control circuitry inputs coupled to the storage interface and configured to receive configuration bits provided by the storage responsive to a control circuitry update trigger, and the control circuitry outputs coupled to first and second sets of peripheral outputs; and a cyclic-redundancy check (CRC) engine coupled to the storage interface, the CRC engine configured to distinguish between purposeful updates to the data in the storage and bit errors in the data in the storage.

Abstract: Built-in self-test (BIST) circuits and related methods are disclosed. An example BIST circuit includes a state machine to generate a control signal to reduce a gate voltage associated with a transistor from a first voltage to a second voltage when an enable signal is asserted, the transistor to be enabled at the first voltage and the second voltage, and assert an alert signal when a gate-to-source voltage associated with the transistor satisfies a threshold when the gate voltage is reduced to the second voltage.

Abstract: An integrated circuit (IC) includes: a storage having a storage interface and addressable bytes, the storage interface coupled to first and second sets of peripheral terminals; control circuitry having control circuitry inputs and control circuitry outputs, the control circuitry inputs coupled to the storage interface and configured to receive configuration bits provided by the storage responsive to a control circuitry update trigger, and the control circuitry outputs coupled to first and second sets of peripheral outputs; and a cyclic-redundancy check (CRC) engine coupled to the storage interface, the CRC engine configured to distinguish between purposeful updates to the data in the storage and bit errors in the data in the storage.

Abstract: Built-in self-test (BIST) circuits and related methods are disclosed. An example BIST circuit includes a state machine to generate a control signal to reduce a gate voltage associated with a transistor from a first voltage to a second voltage when an enable signal is asserted, the transistor to be enabled at the first voltage and the second voltage, and assert an alert signal when a gate-to-source voltage associated with the transistor satisfies a threshold when the gate voltage is reduced to the second voltage.