Abstract: The make-up eyeglass frame is provided with an adjustable nose piece assembly for adjusting the eyeglasses to the nose and face of a wearer. The nose piece assembly is readily removable from a bracket secured between two lens receiving sections for replacement purposes or for storing in a flattened condition. A pair of temples are hingedly mounted to the lens receiving sections to be folded into a flattened condition.

Abstract: The make-up eyeglass frame is provided with an adjustable nose piece assembly for adjusting the eyeglasses to the nose and face of a wearer. The nose piece assembly is readily removable from a bracket secured between two lens receiving sections for replacement purposes or for storing in a flattened condition. A pair of temples are hingedly mounted to the lens receiving sections to be folded into a flattened condition.

Abstract: A probe assembly for testing an integrated circuit includes a probe card of insulating material with a central opening, a rectangular frame with a smaller opening attached to the probe card, four separate probe wings each comprising a flexible laminated member having a conductive ground plane sheet, an adhesive dielectric film adhered to the ground plane, and probe wing traces of spring alloy copper on the dielectric film. Each probe wing has a cantilevered leaf spring portion extending into the central opening and terminates in a group of aligned individual probe fingers provided by respective terminating ends of said probe wing traces. The probe fingers have tips disposed substantially along a straight line and are spaced to correspond to the spacing of respective contact pads along the edge of an IC being tested. Four spring clamps each have a cantilevered portion which contact the leaf spring portion of a respective probe wing, so as to provide an adjustable restraint for one of the leaf spring portions.

Abstract: A probe assembly adapted to test an integrated circuit (IC) device whose contact pads are deployed in a predetermined pattern in a common plane. The assembly includes a film membrane having a planar dielectric contactor zone and an array of suspension wings radiating from this zone. The wings are clamped at their ends by a mounting ring surrounding a port in a printed circuit board which exposes the contactor zone suspended below the board to the IC device to be tested, the ring being secured to the board. Deployed in a matching pattern on the exposed face of the contactor zone and cantilevered therefrom to assume an angle with respect thereto are spring contact fingers that are extensions of traces running along the wings of the membrane to leads on the printed circuit board. These leads extend to respective test terminals on the board which are connectable to electronic instrumentation for conducting tests on the IC device.

Abstract: The described invention includes a rotatably mounted drive mechanism which is provided with a plurality of radially oriented tracks. The drive mechanism preferably comprises a pair of opposed drive disks with colinear radial tracks having tooth-like formations arranged therein. A movable sheave segment is mounted in each track. Each sheave segment is engaged by an endless belt when the drive mechanism traverses through a predetermined arc of rotation but is disengaged from the drive belt when outside the predetermined arc of rotation. Toothed engagement blocks are associated with each sheave segment to provide a engagement blocks for locking the sheave segment into place in the track. A wedge cam is associatd with each sheave segment and is forced by belt pressure to rigidly bias the sheave segemnts' toothed engagement blocks against the tooth-like formations in the track.