Patents by Inventor Jack Lee BEUTH

Jack Lee BEUTH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11491729
    Abstract: A method for training a machine learning engine for modeling of a physical system includes receiving process data representing measurements of a physical system. The method includes applying a transform to values of the at least two variables of the process data to generate a dimensionless parameter having a parameter value corresponding to each measurement of the physical system for the at least two variables. The method includes training the machine learning engine using a set of generated training data including the non-dimensionalized parameter, to output a prediction of a value of a physical effect of the physical system for values of the variables that are not included in the process data. The method includes controlling an additive manufacturing process for the material by setting the at least one physical property to the value of the at least one process variable during fabrication of a part.
    Type: Grant
    Filed: May 2, 2019
    Date of Patent: November 8, 2022
    Assignee: Carnegie Mellon University
    Inventors: Sneha Prabha Narra, Jack Lee Beuth, Jr.
  • Publication number: 20190337232
    Abstract: A method for training a machine learning engine for modeling of a physical system includes receiving process data representing measurements of a physical system. The method includes applying a transform to values of the at least two variables of the process data to generate a dimensionless parameter having a parameter value corresponding to each measurement of the physical system for the at least two variables. The method includes training the machine learning engine using a set of generated training data including the non-dimensionalized parameter, to output a prediction of a value of a physical effect of the physical system for values of the variables that are not included in the process data. The method includes controlling an additive manufacturing process for the material by setting the at least one physical property to the value of the at least one process variable during fabrication of a part.
    Type: Application
    Filed: May 2, 2019
    Publication date: November 7, 2019
    Inventors: Sneha Prabha Narra, Jack Lee Beuth, JR.
  • Patent number: 10328532
    Abstract: In one aspect, a method includes conducting a plurality of tests on process variables of a thermal process, with a test of the plurality of tests being conducted on two or more process variables, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more temperature integrals of the thermal field; and based on results of the plurality of tests, generating a process map of the one or more temperature integrals of the thermal field, with the one or more temperature integrals based on a function of the two or more process variables.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: June 25, 2019
    Assignee: Carnegie Mellon University
    Inventor: Jack Lee Beuth, Jr.
  • Patent number: 10035220
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: July 31, 2018
    Assignee: Carnegie Mellon University
    Inventors: Jack Lee Beuth, Jr., Jason Cho Fox
  • Patent number: 9939394
    Abstract: A method performed by one or more processing devices includes conducting a plurality of tests of a manufacturing process. Each test is conducted at a different combination of at least a first process variable and a second process variable, and each test comprises locally heating a region of a structure, where the local heating results in formation of a thermal field in the structure, and assessing a temperature derivative of the thermal field. Based on results of the plurality of tests, a process map of the temperature derivative of the thermal field is generated, with the temperature derivative based on a function of the first process variable and the second process variable.
    Type: Grant
    Filed: August 16, 2013
    Date of Patent: April 10, 2018
    Assignees: Carnegie Mellon University, Wright State University
    Inventors: Jack Lee Beuth, Jr., Nathan W. Klingbeil, Joy Davis Gockel
  • Patent number: 9933255
    Abstract: Conducting a plurality of tests of a manufacturing process, with each test conducted at a different combination of a first process variable and a second process variable. Each test includes locally heating a region of a part, wherein the local heating results in the formation of a thermal field in the part, and assessing a dimension of the thermal field. In some cases, based on the results of the plurality of tests, a process map of the dimension of the thermal field is generated as a function of the first process variable and the second process variable.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: April 3, 2018
    Assignee: Carnegie Mellon University
    Inventor: Jack Lee Beuth, Jr.
  • Publication number: 20160041111
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Application
    Filed: March 14, 2014
    Publication date: February 11, 2016
    Inventors: Jack Lee Beuth, Jason Cho Fox
  • Publication number: 20160033434
    Abstract: In one aspect, a method includes conducting a plurality of tests on process variables of a thermal process, with a test of the plurality of tests being conducted on two or more process variables, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more temperature integrals of the thermal field; and based on results of the plurality of tests, generating a process map of the one or more temperature integrals of the thermal field, with the one or more temperature integrals based on a function of the two or more process variables.
    Type: Application
    Filed: March 14, 2014
    Publication date: February 4, 2016
    Inventor: Jack Lee BEUTH
  • Publication number: 20150219572
    Abstract: A method performed by one or more processing devices includes conducting a plurality of tests of a manufacturing process. Each test is conducted at a different combination of at least a first process variable and a second process variable, and each test comprises locally heating a region of a structure, where the local heating results in formation of a thermal field in the structure, and assessing a temperature derivative of the thermal field. Based on results of the plurality of tests, a process map of the temperature derivative of the thermal field is generated, with the temperature derivative based on a function of the first process variable and the second process variable.
    Type: Application
    Filed: August 16, 2013
    Publication date: August 6, 2015
    Inventors: Jack Lee Beuth, JR., Nathan W. Klingbeil, Joy Davis Gockel
  • Publication number: 20140249773
    Abstract: Conducting a plurality of tests of a manufacturing process, with each test conducted at a different combination of a first process variable and a second process variable. Each test includes locally heating a region of a part, wherein the local heating results in the formation of a thermal field in the part, and assessing a dimension of the thermal field. In some cases, based on the results of the plurality of tests, a process map of the dimension of the thermal field is generated as a function of the first process variable and the second process variable.
    Type: Application
    Filed: July 27, 2012
    Publication date: September 4, 2014
    Applicant: CARNEGIE MELLON UNIVERSITY
    Inventor: Jack Lee Beuth, JR.