Patents by Inventor Jack Levy

Jack Levy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140255898
    Abstract: A competency assessment system enables reading comprehension and critical thinking skills of a knowledge worker to be assessed. The competency assessment system enables a knowledge worker to create an assertion map based on one or more source literals. The assertion map comprises several assertion objects that link to different portions of the source literals or other assertion objects. The competency assessment system compares the assertion map created by the knowledge worker with another assertion map to assess the worker's reading comprehension and critical thinking skills.
    Type: Application
    Filed: March 7, 2014
    Publication date: September 11, 2014
    Applicant: Pandexio, Inc.
    Inventors: John Richard Burge, Jack Levy
  • Patent number: 6965800
    Abstract: A measurements expert system and method for generating a high-performance measurements software driver. The measurements expert system translates a user's measurement task specification (MTS) specifying a measurement task into a solution, e.g., a run-time specification (RTS), suitable for the user's measurement system. The expert system includes programs for analyzing and validating the received MTS, and for generating the RTS. The RTS is useable to configure measurement devices to perform the measurement task, and to generate a run-time which is executable to perform the specified measurement task. The expert system includes a plurality of experts, e.g., device, channel, timing, reader/writer, control, and streaming experts, etc., each class of which manages different aspects of the MTS. The expert system creates a device expert call tree of associated experts according to the configuration specified by the user, manages the configuration of the MTS, verifies the MTS, and compiles the MTS into the RTS.
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: November 15, 2005
    Assignee: National Instruments Corporation
    Inventors: Geoffrey Schmit, Jonathan Brumley, Brent Schwan, Jack Levy
  • Patent number: 6944606
    Abstract: A measurements expert system and method for generating high-performance measurements software drivers. The measurements expert system is able to interpret a customer's measurement task specification (MTS) specifying a measurement task, explore possible solution paths, and generate a solution, e.g., a run-time specification (RTS), optimized for the customer's measurement system. The expert system includes programs for analyzing and validating a received MTS, and a plurality of measurements experts which are operable to analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences. The final RTS is useable to configure one or more measurement devices according to the RTS, and to generate a run-time which is executable to perform the specified measurement task using the one or more measurement devices.
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: September 13, 2005
    Assignee: National Instruments Corporation
    Inventors: Geoffrey Schmit, Jonathan Brumley, Brent Schwan, Jack Levy
  • Publication number: 20030005180
    Abstract: A measurements expert system and method for generating high-performance measurements software drivers. The measurements expert system is able to interpret a customer's measurement task specification (MTS) specifying a measurement task, explore possible solution paths, and generate a solution, e.g., a run-time specification (RTS), optimized for the customer's measurement system. The expert system includes programs for analyzing and validating a received MTS, and a plurality of measurements experts which are operable to analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences. The final RTS is useable to configure one or more measurement devices according to the RTS, and to generate a run-time which is executable to perform the specified measurement task using the one or more measurement devices.
    Type: Application
    Filed: November 13, 2001
    Publication date: January 2, 2003
    Inventors: Geoffrey Schmit, Jonathan Brumley, Brent Schwan, Jack Levy
  • Publication number: 20030005179
    Abstract: A measurements expert system and method for generating a high-performance measurements software driver. The measurements expert system translates a user's measurement task specification (MTS) specifying a measurement task into a solution, e.g., a run-time specification (RTS), suitable for the user's measurement system. The expert system includes programs for analyzing and validating the received MTS, and for generating the RTS. The RTS is useable to configure measurement devices to perform the measurement task, and to generate a run-time which is executable to perform the specified measurement task. The expert system includes a plurality of experts, e.g., device, channel, timing, reader/writer, control, and streaming experts, etc., each class of which manages different aspects of the MTS. The expert system creates a device expert call tree of associated experts according to the configuration specified by the user, manages the configuration of the MTS, verifies the MTS, and compiles the MTS into the RTS.
    Type: Application
    Filed: November 13, 2001
    Publication date: January 2, 2003
    Inventors: Geoffrey Schmit, Jonathan Brumley, Brent Schwan, Jack Levy