Abstract: Solar photovoltaic (PV) modules have the highest possible conversion of photons to electrons in order to optimize their sunlight-to-electricity energy conversion efficiency. The electric current and sunlight-to-electricity conversion efficiency of CdTe modules is increased by about 20% with a new module design that (1) allows more light to pass through the glass and top layers to reach the PV junction area while (2) protecting the module against manufacturability pitfalls (shorts, shunts, and weak diodes) that have previously prevented the successful development of any equivalent module.

Abstract: Electronic devices, such as memory devices are tested by applying test data, such as vectors of memory data having data field, control and address information, with a tester to detect error responses. Applied test data is captured, compressed and stored for subsequent analysis to isolate the test data associated with the error response. The saved compressed test data is de-compressed to replay the test data for a logic analyzer so that adequate history of the test data exists to determine the test cycles that included the stimulus associated with the error response. Identification of the test cycles that include the stimulus associated with the error response allows creation of test programs that run in reduced time by avoiding empty test cycles not associated with the error response.

Abstract: Electronic devices, such as memory devices are tested by applying test data, such as vectors of memory data having data field, control and address information, with a tester to detect error responses. Applied test data is captured, compressed and stored for subsequent analysis to isolate the test data associated with the error response. The saved compressed test data is de-compressed to replay the test data for a logic analyzer so that adequate history of the test data exists to determine the test cycles that included the stimulus associated with the error response. Identification of the test cycles that include the stimulus associated with the error response allows creation of test programs that run in reduced time by avoiding empty test cycles not associated with the error response.

Abstract: A wire tying tool having a set of movable talons for channeling a loop of hard wire around a rebar joint or other object(s) to be tied with a wire knot at high speed; a heavy duty wire drive with a pullback feature to retract the loop under tension to tighten the loop around the joint; a clutch-controlled retractable reel to hold the tension on the hard wire on the reel; a spinner/cutter that extrudes a knot by turning, kinking, and cutting the wire (holding the cut ends under tension) and then spinning in complete revolutions to twist the wire into a knot while drawing the spinner away from the work surface. In a preferred embodiment a single reversible motor powers each of a wire drive, a talon drive and a spinner drive; logic and control elements control a sequence of operations of the various drives.