Abstract: An electronic image analyzer which is adapted to inspect a given transparent object or a succession of similar objects by producing an illuminated image of the object on a photoelectronic sensor which is then electronically scanned for the purpose of inspecting the image within an electronic look window having the shape of a standard object contour, the shape having been previously stored electronically and capable of being called out through suitable circuits so as to be superimposed on the image. Further, arbitrarily shaped masks may be generated separately or in combination and superimposed on portions of the image within said electronic look window so as to obscure areas which interfere with the inspection process of other areas.