Patents by Inventor Jack Sachitano

Jack Sachitano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4902640
    Abstract: A mixed bipolar-CMOS self-aligned process and integrated circuit provide a high performance NPN bipolar transistor in parallel to fabrication of a PMOSFET and an NMOSFET. Gate and base contacts are formed in a first polysilicon layer. The base contacts are implanted with P+ ion concentrations for diffusing base contact regions of the substrate in a later drive-in step. Source and drain contacts and emitter contacts are formed in a second polysilicon layer. The source and drain contacts are formed as a unit and then separated into discrete contacts by a spin-on polymer planarization and etch-back procedure. Lightly-doped lateral margins of the source, drain and base regions are ion-implanted in an initial low concentration (e.g. about 10.sup.13 atoms/cm.sup.2). The gate and base contact structures serve as a mask to self-align the implants. Then, the gate and base structures are enclosed in an oxide box having sidewalls.
    Type: Grant
    Filed: August 19, 1987
    Date of Patent: February 20, 1990
    Assignee: Tektronix, Inc.
    Inventors: Jack Sachitano, Hee K. Park, Paul K. Boyer, Gregory C. Eiden, Tadanori Yamaguchi
  • Patent number: 4826782
    Abstract: An intermediate structure in the fabrication of a metal-oxide semiconductor field-effect transistor is made from a substrate of p+ silicon having an elongate insulated gate structure on its main face. First and second areas of the main face are exposed along first and second opposite sides respectively of the gate structure. Donor impurity atoms are introduced into the substrate by way of at least the first area of the main face, to achieve a predetermined concentration of electrons in a region of the substrate that is subjacent the first area of the main face. The gate structure is opague to the impurity atoms. A sidewall of silicon dioxide is formed along the first side of the gate structure, whereby a strip of the first area of the main face is covered by the sidewall and other parts of the first area remain exposed adjacent the sidewall.
    Type: Grant
    Filed: April 17, 1987
    Date of Patent: May 2, 1989
    Assignee: Tektronix, Inc.
    Inventors: Jack Sachitano, Paul K. Boyer, Hee K. Park, Gregory C. Eiden
  • Patent number: 4229756
    Abstract: An improved, ultra high speed (2GHz) CMOS inverter structure comprising a double-diffused, planar p-channel transistor and a nonplanar n-channel transistor formed within adjacent surface fields on the same substrate. The n-channel device includes a source region formed in an elevated, plateau region on the substrate, and a narrow, implanted channel-forming layer that extends through the plateau beneath the source region and terminates at a slope joining the plateau to surrounding lower elevation portions of the substrate. A drain region is formed adjacent the foot of the slope, spaced from the channel to provide a drift region between them.
    Type: Grant
    Filed: February 9, 1979
    Date of Patent: October 21, 1980
    Assignee: Tektronix, Inc.
    Inventors: Shuichi Sato, Tadanori Yamaguchi, Jack Sachitano