Patents by Inventor Jack W. Lakey

Jack W. Lakey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8120380
    Abstract: An electronic device power testing method is provided in which applying a nominal voltage to an electronic component, introducing a voltage disruption to the nominal voltage, and repeating the voltage disruption for a specified number of instances is done. The present invention also can be implemented as an electronic device power tester.
    Type: Grant
    Filed: March 30, 2001
    Date of Patent: February 21, 2012
    Assignee: Seagate Technology LLC
    Inventors: Errol C. Heiman, Henry E. Davenport, Jack W. Lakey
  • Publication number: 20020005730
    Abstract: An electronic device power testing method is provided in which applying a nominal voltage to an electronic component, introducing a voltage disruption to the nominal voltage, and repeating the voltage disruption for a specified number of instances is done.
    Type: Application
    Filed: March 30, 2001
    Publication date: January 17, 2002
    Inventors: Errol C. Heiman, Henry E. Davenport, Jack W. Lakey