Patents by Inventor Jackson Callaghan

Jackson Callaghan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus with signal quality feedback
    Patent number: 12704975
    Abstract: Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
    Type: Grant
    Filed: August 29, 2024
    Date of Patent: August 11, 2026
    Assignee: Micron Technology, Inc.
    Inventor: Jackson Callaghan
  • APPARATUS WITH SIGNAL QUALITY FEEDBACK
    Publication number: 20240419336
    Abstract: Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
    Type: Application
    Filed: August 29, 2024
    Publication date: December 19, 2024
    Inventor: Jackson Callaghan
  • Apparatus with signal quality feedback
    Patent number: 12124706
    Abstract: Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
    Type: Grant
    Filed: August 27, 2022
    Date of Patent: October 22, 2024
    Assignee: Micron Technology, Inc.
    Inventor: Jackson Callaghan
  • APPARATUS WITH SIGNAL QUALITY FEEDBACK
    Publication number: 20240069744
    Abstract: Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
    Type: Application
    Filed: August 27, 2022
    Publication date: February 29, 2024
    Inventor: Jackson Callaghan