Patents by Inventor Jacob Kerssemakers

Jacob Kerssemakers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130102083
    Abstract: The invention concerns a method and apparatus for determining one or more characterizing features of a macromolecule, in particular torque and/or twist of nucleic acids like DNA, using magnetic fields.
    Type: Application
    Filed: June 21, 2011
    Publication date: April 25, 2013
    Inventors: Nynke Dekker, Jacob Kerssemakers, Jan Lipfert
  • Patent number: 8415613
    Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: April 9, 2013
    Assignee: JPK Instruments AG
    Inventors: Sven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps
  • Publication number: 20110302676
    Abstract: The invention relates to a method for examining a sample by using probe microscopy, in particular scanning probe microscopy in which a sample is examined by way of a probe microscope with a multi-part measuring probe comprising a probe element and a guide clement guiding the probe element during the probe microscopy examination with the method furthermore comprising the following steps: capturing of noise measuring signals for the measuring probe in a non measuring configuration in which the probe clement is arranged separately from the guide element, capturing of measuring signals for the measuring probe in a measuring configuration in which the probe element is guided by the guide element, and analysing the measuring signals by at least partially assigning the measuring signals to the noise measuring signals. Further, the invention relates to a device for examining a sample with a probe microscope.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 8, 2011
    Applicant: JPK INSTRUMENTS AG
    Inventors: Jacob Kerssemakers, Detlef Knebel
  • Publication number: 20100251437
    Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
    Type: Application
    Filed: May 30, 2008
    Publication date: September 30, 2010
    Applicant: JPK INSTRUMENTS AG
    Inventors: Sven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps