Patents by Inventor Jacob MEACHEN

Jacob MEACHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240056194
    Abstract: A packaged optical receiver, comprising: a photodiode configured to receive an optical signal; a transimpedance amplifier (TIA) coupled to the photodiode; and a signal pin; wherein the optical receiver is configured to receive, via the signal pin, a reset signal; and wherein the optical receiver is configured to output in response to the reset signal, via the signal pin, a received signal strength indication (RSSI) for the received optical signal.
    Type: Application
    Filed: August 10, 2022
    Publication date: February 15, 2024
    Inventor: Jacob MEACHEN
  • Patent number: 10481194
    Abstract: A test station and method of testing a design under test are disclosed. One method includes applying a first test frequency signal to a reference path to determine a first known attenuation level, and applying the first test frequency signal to a design under test to determine a first tested attenuation level of the design under test at the first test frequency. The method also includes applying a second test frequency signal to the reference path to determine a second known attenuation level, and applying the second test frequency signal to the design under test to determine a second tested attenuation level of the design under test at the second test frequency. The method includes determining whether the design under test is faulty based on the first tested attenuation level and the second tested attenuation level.
    Type: Grant
    Filed: October 2, 2014
    Date of Patent: November 19, 2019
    Assignee: CommScope Connectivity UK Limited
    Inventors: Ian Robert George, Bernard Harold Hammond, Jr., Jacob Meachen, Gordon John White
  • Publication number: 20160252561
    Abstract: A test station and method of testing a design under test are disclosed. One method includes applying a first test frequency signal to a reference path to determine a first known attenuation level, and applying the first test frequency signal to a design under test to determine a first tested attenuation level of the design under test at the first test frequency. The method also includes applying a second test frequency signal to the reference path to determine a second known attenuation level, and applying the second test frequency signal to the design under test to determine a second tested attenuation level of the design under test at the second test frequency. The method includes determining whether the design under test is faulty based on the first tested attenuation level and the second tested attenuation level.
    Type: Application
    Filed: October 2, 2014
    Publication date: September 1, 2016
    Inventors: Ian Robert GEORGE, Bernard Harold HAMMOND, JR., Jacob MEACHEN, Gordon John WHITE