Patents by Inventor Jacob Walinga

Jacob Walinga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for mass analysis and structure analysis of a surface layer by means of ion scattering
    Patent number: 3970849
    Abstract: A device utilizing an energy analyzer having two coaxial cylindrical electrodes, a coaxial ring-shaped detector comprising a large number of individual detector elements to provide information on the atomic structure of the surface layer.
    Type: Grant
    Filed: November 19, 1974
    Date of Patent: July 20, 1976
    Assignee: U.S. Philips Corporation
    Inventors: Hidde Herman Brongersma, Jacob Walinga