Patents by Inventor Jacob Woolsey

Jacob Woolsey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11346818
    Abstract: According to various examples, a method for non-destructive detection of defects in a semiconductor die is described. The method may include positioning an emitter above the semiconductor die. The method may include generating an emitted wave using the emitter that is directed to a focal point on a surface of the die. The method may include generating a reflected wave from the focal point. The focal point may act as a point source reflecting the emitted wave. The method may include positioning a receiver above the die to receive the reflected wave. The method may also include measuring the reflected wave to detect modulations in amplitude in the reflected wave.
    Type: Grant
    Filed: May 22, 2020
    Date of Patent: May 31, 2022
    Assignee: Intel Corporation
    Inventors: Mario Pacheco, Odissei Touzanov, Jacob Woolsey, Deepak Goyal
  • Publication number: 20210364474
    Abstract: According to various examples, a method for non-destructive detection of defects in a semiconductor die is described. The method may include positioning an emitter above the semiconductor die. The method may include generating an emitted wave using the emitter that is directed to a focal point on a surface of the die. The method may include generating a reflected wave from the focal point. The focal point may act as a point source reflecting the emitted wave. The method may include positioning a receiver above the die to receive the reflected wave. The method may also include measuring the reflected wave to detect modulations in amplitude in the reflected wave.
    Type: Application
    Filed: May 22, 2020
    Publication date: November 25, 2021
    Inventors: Mario Pacheco, Odissei Touzanov, Jacob Woolsey, Deepak Goyal