Abstract: An apparatus for making drawings including a platen, an X-Y forcer slidably connected to the platen and a high speed holder adjustably connected to the forcer. The holder includes a plurality of separately actuatable mechanisms with each mechanism being connected to a tool for movement of the tool into or out of contact with a working surface. Means are included to precisely control each of the mechanisms in controlling the degree of contact which the tools make with the working surface. Also, means are included to precisely position each tool with respect to the mechanism which moves the tool into contact with the working surface.An apparatus for performing a working operation on a surface which apparatus includes a platen, an X-Y forcer slidably mounted thereon and a tool carried by the forcer for contact with the surface. Additionally, the apparatus includes means to vary the force applied by the tool against the working surface in response to the speed of movement of the tool with respect to the surface.

Abstract: A probe for testing an electrical circuit includes a dielectric support body and a pair of spring arms each having an inner end fixed to the support body and an outer end free to deflect with respect to the support body. Means for connecting the outer ends of the arms supports a probe tip having a point movable with the deflection of the arms into contact with a predetermined point on the electrical circuit to be tested. Means responsive to a signal provides for the deflection of the arms and the movement of the probe tip into contact with the chip. The arms have different lengths providing the probe tip with movement along a substantially straight line with respect to the plane of the electrical circuit.

Abstract: Testing of integrated circuit components of the silicon wafer type for grading purposes is accomplished by supporting the wafer matrix on a platform type work table which is indexed in an x-y coordinate fashion, with the work table being moved vertically to a test position such that the test probes make contact with a precise predetermined position corresponding to the precise location of that portion of the integrated circuit to be tested. The work table is movable vertically with reference to a predetermined axis and rotatable with respect thereto such that the surface of the table remains perpendicular to the reference axis. The chuck assembly for moving the table includes a housing having a bore whose center forms the axis, with a chuck plate mounted for sliding movement in the bore. The end of the chuck plate is in the form of a flanged spool which receives bearing-eccentric assembly for effecting vertical movement while permitting rotation of the spool and the attached chuck plate.

Abstract: An automatic cable forming system incorporating an X-Y positioner for automatically laying a plurality of individual wires in a predetermined pattern to form a complex cable and including an array of individual spools each including a tensioning device to produce a predetermined tension on a wire as it is unspooled and to take up any slack in the wire. The system also includes a plurality of individual capstan pulleys each receiving an individual wire from one of the spools and with a single capstan drive for engaging one capstan pulley at a time for individually feeding the plurality of wires from the spools. The wires pass to a plurality of individual clamps for clamping the plurality of individual wires except the wire fed from the capstan pulley engaged by the capstan drive, and with a wire feed mechanism intermediate the capstan drive and the clamps for feeding the wires to a single wire head.

Abstract: Testing of integrated circuit components of the silicon wafer type for grading purposes is accomplished by supporting the wafer matrix on a platform type work table which is indexed in an x-y coordinate fashion, with the work table being moved vertically to a test position such that the test probes make contact with a precise predetermined position corresponding to the precise location of that portion of the integrated circuit to be tested. The work table is movable vertically with reference to a predetermined axis and rotatable with respect thereto such that the surface of the table remains perpendicular to the reference axis. The chuck assembly for moving the table includes a housing having a bore whose center forms the axis, with a chuck plate mounted for sliding movement in the bore. The end of the chuck plate is in the form of a flanged spool which receives bearing-eccentric assembly for effecting vertical movement while permitting rotation of the spool and the attached chuck plate.