Patents by Inventor Jae Bun Ryu

Jae Bun Ryu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test method for high speed semiconductor devices using a clock modulation technique
    Patent number: 6199185
    Abstract: A test method for testing a semiconductor device includes providing a tester which generates a plurality of general clock signals and which has a minimum test cycle time greater than an operational cycle time of the semiconductor device. Then a modulated clock signal is generated from a first general clock signal and a second general clock signal so that the modulated clock signal has a minimum cycle time no greater than the operational cycle time. The next steps include supplying the modulated clock signal to the semiconductor device as a predetermined control signal, supplying test signals to the semiconductor device as specified by a functional test item, and comparing an output of the semiconductor device to a reference value.
    Type: Grant
    Filed: April 20, 1998
    Date of Patent: March 6, 2001
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ki Bong Ju, Jae Bun Ryu, Il Sik Chi, Heui Han