Abstract: A complementary thin film transistor (TFT) includes a substrate and a first TFT and a second TFT disposed on the substrate, wherein a first conductive semiconductor layer of the first TFT and a second gate electrode layer of the second TFT are disposed in the same layer and include the same material.

Abstract: A shape measurement device includes a stylus configured to contact an object to be measured; a measurement arm that supports the stylus to allow the stylus to contact the object to be measured; a measurement arm part that supports the measurement arm; and a measurement arm support that supports the measurement arm part to allow the stylus to move along an outer shape of the object to be measured. The measurement arm support includes a support body provided with a movement rail formed on a top surface thereof. A body coupling block is coupled to the movement rail to move along the movement rail and is detachably coupled to the measurement arm part. The measurement arm portion includes a body provided with a block accommodation groove to accommodate the body coupling block and a position-fixing member coupled to a lower surface of the body defining the block accommodation groove.

Abstract: The present invention relates to a shape measurement apparatus comprising: a driving body 130; a measurement arm part 110 having a stylus 111 coming into contact with an object to be measured, and an arm 113 for supporting the stylus 111 so that the stylus 111 comes into contact with the object to be measured; a measurement arm support part 120 coupled to an end of the arm 113; a pivot 121 for rotatably supporting the measurement arm support part 120 with respect to the driving body 130; and an actuator part 140 for controlling the measurement arm support part 120 to rotate up and down with respect to the pivot 121 so that the stylus 111 moves along the object to be measured.

Abstract: The present invention relates to a shape measurement apparatus comprising: a driving body 130; a measurement arm part 110 having a stylus 111 coming into contact with an object to be measured, and an arm 113 for supporting the stylus 111 so that the stylus 111 comes into contact with the object to be measured; a measurement arm support part 120 coupled to an end of the arm 113; a pivot 121 for rotatably supporting the measurement arm support part 120 with respect to the driving body 130; and an actuator part 140 for controlling the measurement arm support part 120 to rotate up and down with respect to the pivot 121 so that the stylus 111 moves along the object to be measured.

Abstract: Disclosed herein is a shape measurement device including: a stylus (131) configured to contact an object to be measured; a measurement arm (130) configured to support the stylus (131) to allow the stylus (131) to contact the object to be measured; a measurement arm part (120) configured to support the measurement arm (130); and a measurement arm support (110) configured to support the measurement arm part (120) to allow the stylus (131) to move along an outer shape of the object to be measured, wherein the measurement arm support (110) includes: a support body (111) provided with a movement rail (113) formed on a top surface thereof, the measurement arm part (120) moving along the movement rail (113); a body coupling block (115) coupled to the movement rail (113) to move along the movement rail and detachably coupled to the measurement arm part (120), the body coupling block having a position-fixing groove (116) formed in a central area thereof; and a first magnet part (117) and a second magnet part (118) cou

Abstract: Aspects of the present invention are directed to apparatuses, arrangements, systems and methods for collecting information using one or more modalities. As consistent with one or more embodiments, an apparatus includes first and second scanning mirror arrangements having different scanning axes and respectively facing different directions. The first scanning mirror arrangement directs source light and image light in two paths, and the second scanning mirror arrangement directs image light from a target to the first scanning mirror arrangement. The first and second scanning mirror arrangements cooperatively scan source light from the first scanning mirror and via the second scanning mirror to target locations with at least two degrees of freedom, and direct image light from the target locations.

Abstract: Aspects of the present invention are directed to apparatuses, arrangements, systems and methods for collecting information using one or more modalities. As consistent with one or more embodiments, an apparatus includes first and second scanning mirror arrangements having different scanning axes and respectively facing different directions. The first scanning mirror arrangement directs source light and image light in two paths, and the second scanning mirror arrangement directs image light from a target to the first scanning mirror arrangement. The first and second scanning mirror arrangements cooperatively scan source light from the first scanning mirror and via the second scanning mirror to target locations with at least two degrees of freedom, and direct image light from the target locations.