Patents by Inventor Jae-Eung Shim

Jae-Eung Shim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    Patent number: 7324398
    Abstract: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.
    Type: Grant
    Filed: September 27, 2005
    Date of Patent: January 29, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae-Eung Shim, Jung-Yong Choi, Young-Gu Kang, Min-Gyu Hwang
  • Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
    Publication number: 20060077742
    Abstract: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.
    Type: Application
    Filed: September 27, 2005
    Publication date: April 13, 2006
    Inventors: Jae-Eung Shim, Jung-Yong Choi, Young-Gu Kang, Min-Gyu Hwang