Patents by Inventor Jae-Heun Woo

Jae-Heun Woo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11378665
    Abstract: A distance measuring apparatus includes an image sensor and an image sensor driver. The image sensor includes a photodiode, a first capacitor and a second capacitor, and a first transfer gate and a second transfer gate configured to transmit an output of the photodiode to the respective first and second capacitors. The image sensor driver is configured to complementarily drive the first transfer gate and the second transfer gate.
    Type: Grant
    Filed: August 9, 2017
    Date of Patent: July 5, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jae-Wan Kim, Jae-Yong Lee, Jong-Ahn Kim, Jae-Heun Woo, Young Pyo Hong
  • Patent number: 10801864
    Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.
    Type: Grant
    Filed: January 8, 2019
    Date of Patent: October 13, 2020
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jong-Ahn Kim, Jae-Wan Kim, Jae-Yong Lee, Jonghan Jin, Jae-Heun Woo
  • Publication number: 20190250013
    Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.
    Type: Application
    Filed: January 8, 2019
    Publication date: August 15, 2019
    Inventors: Jong-Ahn KIM, Jae-Wan KIM, Jae-Yong LEE, Jonghan JIN, Jae-Heun WOO
  • Publication number: 20190162852
    Abstract: A distance measuring apparatus includes an image sensor and an image sensor driver. The image sensor includes a photodiode, a first capacitor and a second capacitor, and a first transfer gate and a second transfer gate configured to transmit an output of the photodiode to the respective first and second capacitors. The image sensor driver is configured to complementarily drive the first transfer gate and the second transfer gate.
    Type: Application
    Filed: August 9, 2017
    Publication date: May 30, 2019
    Inventors: Jae-Wan KIM, Jae-Yong LEE, Jong-Ahn KIM, Jae-Heun WOO, Young Pyo HONG
  • Patent number: 9927224
    Abstract: A thickness measuring apparatus and a thickness measuring method. The thickness measuring apparatus includes a light source outputting an extended monochromatic light with coherence; a collimating lens converting output light of the light source into incident beam of parallel ray; a beam splitter reflecting and providing the incident beam to a measurement target and transmitting first reflection light reflected on a top surface of the measurement target and second reflection light reflected on a bottom surface of the measurement target; an imaging lens disposed between the measurement target and the beam splitter with a predetermined focal distance to receive and provide the incident beam to a measurement position of the measurement target disposed on the focal distance; a camera photographing an interference fringe formed by the first and second reflection lights and outputting an interference fringe image; and a processing part.
    Type: Grant
    Filed: January 5, 2016
    Date of Patent: March 27, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jong-Ahn Kim, Jae-Wan Kim, Jae-Yong Lee, Jae-Heun Woo
  • Publication number: 20160202038
    Abstract: A thickness measuring apparatus and a thickness measuring method. The thickness measuring apparatus includes a light source outputting an extended monochromatic light with coherence; a collimating lens converting output light of the light source into incident beam of parallel ray; a beam splitter reflecting and providing the incident beam to a measurement target and transmitting first reflection light reflected on a top surface of the measurement target and second reflection light reflected on a bottom surface of the measurement target; an imaging lens disposed between the measurement target and the beam splitter with a predetermined focal distance to receive and provide the incident beam to a measurement position of the measurement target disposed on the focal distance; a camera photographing an interference fringe formed by the first and second reflection lights and outputting an interference fringe image; and a processing part.
    Type: Application
    Filed: January 5, 2016
    Publication date: July 14, 2016
    Inventors: Jong-Ahn Kim, Jae-Wan Kim, Jae-Yong Lee, Jae-Heun Woo