Patents by Inventor Jae-Hyoung KO

Jae-Hyoung KO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory device and operating method thereof
    Patent number: 10074441
    Abstract: A memory device includes a pass/fail check circuit configured to compare the number of memory cells, which are verified as being a program fail based on a result of verifying program operations of a first group of memory cells of a plurality of memory cells, with a first reference bit number, and to check whether the first group of memory cells is a pass or fail and a control circuit configured to control the pass/fail check circuit to recheck whether the first group of memory cells is the pass or fail based on a second reference bit number smaller than the first reference bit number when the first group of memory cells is found to be the pass based on a result of a pass/fail check operation of the pass/fail check circuit.
    Type: Grant
    Filed: June 6, 2016
    Date of Patent: September 11, 2018
    Assignee: SK Hynix Inc.
    Inventors: Byoung-Sung You, Jae-Hyoung Ko
  • MEMORY DEVICE AND OPERATING METHOD THEREOF
    Publication number: 20170162273
    Abstract: A memory device includes a pass/fail check circuit configured to compare the number of memory cells, which are verified as being a program fail based on a result of verifying program operations of a first group of memory cells of a plurality of memory cells, with a first reference bit number, and to check whether the first group of memory cells is a pass or fail and a control circuit configured to control the pass/fail check circuit to recheck whether the first group of memory cells is the pass or fail based on a second reference bit number smaller than the first reference bit number when the first group of memory cells is found to be the pass based on a result of a pass/fail check operation of the pass/fail check circuit.
    Type: Application
    Filed: June 6, 2016
    Publication date: June 8, 2017
    Inventors: Byoung-Sung YOU, Jae-Hyoung KO