Abstract: A display device includes a first semiconductor layer disposed on a substrate; a first insulating layer disposed on the first semiconductor layer; a scan line disposed on the first insulating layer; a second insulating layer on the scan line; an inverted scan line on the second insulating layer; a third insulating layer disposed on the inverted scan line; a second semiconductor layer disposed on the third insulating layer; a fourth insulating layer disposed on the second semiconductor layer; an initializing voltage line disposed on the fourth insulating layer and overlapping the scan line; a first transistor including a channel disposed in the first semiconductor layer and receiving a gate signal through the scan line; and a second transistor including a channel disposed in the second semiconductor layer and receiving a gate signal through the inverted scan line.

Abstract: Disclosed are various methods for transmitting or receiving data or control information having high reliability conditions. A method for operating a terminal which transmits uplink control information (UCI) includes: a step of generating UCI; a step of comparing the priority of an uplink (UL) control channel for the transmission of the UCI with the priority of a UL data channel when some symbols of the UL control channel and the UL data channel overlap; and a step of selecting the UL channel having a higher priority among the UL control channel and the UL data channel, and transmitting the UCI to a base station through the selected UL channel.

Abstract: Provided is an air conditioning system including: a case including a first sub-case including an outdoor air inlet and a discharge outlet, and a second sub-case including an air returning inlet and an air supply inlet; a desiccant rotor module; a heat exchanger including a first sub-heat exchanger and a second sub-heat exchanger, a ventilator including a first sub-ventilator and a second sub-ventilator; and a damper including a first sub-damper and a second sub-damper, wherein the first sub-damper is installed downstream of the first region of the desiccant rotor module, and the second sub-damper is installed downstream of the second region of the desiccant rotor module, wherein the desiccant rotor module and the heat exchanger are integrally assembled so as to be detachably installed in the case, wherein the outdoor air and the indoor air do not mix with each other.

Abstract: An electronic device and a method of operating the electronic device are provided. The method includes sensing a weight of an intravenous (IV) fluid injected into a user; measuring a time remaining until injection of the IV fluid is completed, based on the sensed weight of the IV fluid; determining whether the measured remaining time is equal to or less than a predetermined value; and transmitting an alarm signal indicating an injection state of the IV fluid to an external device based on a result of the determining.

Abstract: Provided is an air conditioning system including: a case including a first sub-case including an outdoor air inlet and a discharge outlet, and a second sub-case including an air returning inlet and an air supply inlet; a desiccant rotor module; a heat exchanger including a first sub-heat exchanger and a second sub-heat exchanger, a ventilator including a first sub-ventilator and a second sub-ventilator; and a damper including a first sub-damper and a second sub-damper, wherein the first sub-damper is installed downstream of the first region of the desiccant rotor module, and the second sub-damper is installed downstream of the second region of the desiccant rotor module, wherein the desiccant rotor module and the heat exchanger are integrally assembled so as to be detachably installed in the case, wherein the outdoor air and the indoor air do not mix with each other.

Abstract: An electronic device and a method of operating the electronic device are provided. The method includes sensing a weight of an intravenous (IV) fluid injected into a user; measuring a time remaining until injection of the IV fluid is completed, based on the sensed weight of the IV fluid; determining whether the measured remaining time is equal to or less than a predetermined value; and transmitting an alarm signal indicating an injection state of the IV fluid to an external device based on a result of the determining.

Abstract: A memory test device for testing a memory device is provided. The memory test device includes a sequencer configured to output first and second sequencer outputs that are different from each other in response to a sequencer input. A first pattern generator is configured to output a first test pattern according to the first sequencer output. A second pattern generator is configured to output a second test pattern according to the second sequencer output. A selector is coupled to the first and second pattern generators and configured to output write data according to the first test pattern and the second test pattern.

Abstract: A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.

Abstract: A memory test device for testing a memory device is provided. The memory test device includes a sequencer configured to output first and second sequencer outputs that are different from each other in response to a sequencer input. A first pattern generator is configured to output a first test pattern according to the first sequencer output. A second pattern generator is configured to output a second test pattern according to the second sequencer output. A selector is coupled to the first and second pattern generators and configured to output write data according to the first test pattern and the second test pattern.

Abstract: A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.