Patents by Inventor Jae-Min Jeon

Jae-Min Jeon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250210387
    Abstract: An inspection device of a semiconductor device includes: a semiconductor device which has a first face and a second face that are opposite to each other; and a measuring device which faces the first face, and measures heat of the semiconductor device, wherein the measuring device includes: a heat generating unit which generates heat on the second face of the semiconductor device, by emitting electromagnetic waves that penetrate through the semiconductor device; and a thermal image capturing unit which generates image data about a temperature of the second face of the semiconductor device.
    Type: Application
    Filed: August 26, 2024
    Publication date: June 26, 2025
    Inventors: Soon Kyu HWANG, Jin Yeol YANG, Jae-Min JEON, Je Hyun HA
  • Publication number: 20240118196
    Abstract: In the case of a gas in which several gases are mixed, a type and concentration of the gas may be incorrectly measured when measured using only an optical band-pass filter. The invention of the present application is directed to providing a technology in which a plurality of broadband band-pass filters having overlapping regions are provided to calculate a magnitude of absorption for each wavelength band for light passing through each broadband band-pass filter, thereby identifying the presence of a gas of interest and the presence of a gas other than the gas of interest.
    Type: Application
    Filed: September 8, 2023
    Publication date: April 11, 2024
    Inventors: Cheol Woo NAM, Byung Yul MOON, Eung Yul KIM, Jae Hwan KIM, Chun Ho SHIN, Kwang Hun PARK, Myun Gu CHOI, Chang Hwang CHOI, Yong Geol KIM, Jae Min JEON
  • Publication number: 20230197485
    Abstract: Disclosed are semiconductor inspection apparatuses, systems, and methods. The semiconductor inspection method comprises heating a top surface of a semiconductor package, capturing the top surface of the heated semiconductor package to obtain thermal image data, and analyzing the thermal image data. The analyzing the thermal image data includes analyzing first thermal image data about the top surface at a first region of the semiconductor package, and analyzing second thermal image data about the top surface at a second region of the semiconductor package. The analyzing the first thermal image data includes obtaining first region data about temperature distribution at the top surface of the first region, and using the first region data to obtain thickness data of a cover molding layer about thickness distribution of the molding layer on the chip in the first region.
    Type: Application
    Filed: August 18, 2022
    Publication date: June 22, 2023
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Soonkyu HWANG, Jinyeol YANG, Haegu LEE, Jae-Min JEON, Jin Hee HAN
  • Publication number: 20060117102
    Abstract: A network diagnostic method and apparatus includes: a database adapted to store set data for diagnosis; a scheduler adapted to determine whether a condition to perform a diagnosis is satisfied, and to begin diagnosis when it has been determined that the condition to perform a diagnosis has been satisfied; and a diagnostic manager adapted to perform diagnosis according to the set data stored in the database in response to an instruction to begin diagnosis from the scheduler.
    Type: Application
    Filed: November 28, 2005
    Publication date: June 1, 2006
    Inventor: Jae-Min Jeon