Abstract: Disclosed are a drive wheel bearing and a method of manufacturing the same.

Abstract: Disclosed are a drive wheel bearing and a method of manufacturing the same.

Abstract: A test handler which is capable of transporting and testing a plurality of USB memory devices is provided. The handler includes a tray loaded with USB memory devices for testing, and a loading/unloading picker which transfers the USB memory devices from the tray to a shuffle for transport to a test socket. The shuffle moves to insert connectors of the USB memory devices into corresponding USB ports of a test socket for testing, and to extract the connectors from the USB ports after testing. The loading/unloading picker is capable of detecting an orientation of the connectors of the USB memory devices to ensure proper insertion into corresponding USB ports in the test socket.

Abstract: The present invention relates to a loading/unloading control apparatus of a semiconductor device and a control method thereof in which a time for loading/unloading a semiconductor device can be saved when a produced semiconductor device is loaded and unloaded to be tested. The present invention provides a loading/unloading control method of a semiconductor device including the steps of: determining whether a semiconductor device for being sorted to an unloading buffer exists by a microprocessor; determining whether a sorting tray has been prepared when the semiconductor device exists to be sorted to the unloading buffer; requiring the sorting tray to be replaced by the microprocessor when the sorting tray has not been prepared; and feeding the semiconductor device served at the unloading buffer to the sorting buffer by a X-Y axis picker during the replacing of sorting tray.