Patents by Inventor JAEEUN YOON

JAEEUN YOON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11835579
    Abstract: A memory device includes; a memory cell array including memory cells, a row decoder selecting a word line in response to a received address, and control logic including a sensing capacitor having a size proportional to a size of a word line capacitor associated with the selected word line. The control logic measures line resistance of the selected word line by precharging the selected word line, performing a charge sharing operation between the selected word line and the sensing capacitor following the precharging of the selected word line, and measuring a voltage of the sensing capacitor following the performing of the charge sharing operation.
    Type: Grant
    Filed: June 1, 2021
    Date of Patent: December 5, 2023
    Inventors: Hwangju Song, Jaeeun Yoon, Jiseok Lee, Sangwon Hwang
  • Patent number: 11798645
    Abstract: A storage device for performing a reliability check by using error correction code (ECC) data is provided. The storage device includes a memory controller configured to detect the number of errors of second read data read out by a second read operation, based on ECC data of first read data read by a first read operation of a memory device. The memory controller includes a memory check circuit that includes a counter configured to count states of memory cells, a comparator configured to compare respective count numbers of the states with one another, and a register configured to store the number of errors based on a result of the comparison.
    Type: Grant
    Filed: September 7, 2021
    Date of Patent: October 24, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jiseok Lee, Hwangju Song, Namyong Kim, Jaeeun Yoon, Sangmu Lee, Sangwon Hwang
  • Publication number: 20220208294
    Abstract: A storage device for performing a reliability check by using error correction code (ECC) data is provided. The storage device includes a memory controller configured to detect the number of errors of second read data read out by a second read operation, based on ECC data of first read data read by a first read operation of a memory device. The memory controller includes a memory check circuit that includes a counter configured to count states of memory cells, a comparator configured to compare respective count numbers of the states with one another, and a register configured to store the number of errors based on a result of the comparison.
    Type: Application
    Filed: September 7, 2021
    Publication date: June 30, 2022
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Jiseok LEE, Hwangju SONG, Namyong KIM, Jaeeun YOON, Sangmu LEE, Sangwon HWANG
  • Publication number: 20220187365
    Abstract: A memory device includes; a memory cell array including memory cells, a row decoder selecting a word line in response to a received address, and control logic including a sensing capacitor having a size proportional to a size of a word line capacitor associated with the selected word line. The control logic measures line resistance of the selected word line by precharging the selected word line, performing a charge sharing operation between the selected word line and the sensing capacitor following the precharging of the selected word line, and measuring a voltage of the sensing capacitor following the performing of the charge sharing operation.
    Type: Application
    Filed: June 1, 2021
    Publication date: June 16, 2022
    Inventors: HWANGJU SONG, JAEEUN YOON, JISEOK LEE, SANGWON HWANG