Abstract: A predictive maintenance algorithm providing method for bus maintenance priority determination according to the present invention includes operations of (a) grouping and classifying, by a data processing unit of an operational server, a plurality of buses to be monitored according to preset classification criteria, (b) receiving, by a monitoring unit of the operational server, bus monitoring information including a plurality of types of data collected by vehicle information collection devices installed on the buses for each group classified according to the operation (a), (c) performing, by the data processing unit, refinement on the bus monitoring information, (d) inputting, by the data processing unit, the bus monitoring information refined in the operation (c) as training data for an artificial intelligence machine to build an artificial intelligence model for determining bus maintenance priorities, (e) re-receiving, by the monitoring unit, the bus monitoring information collected by the vehicle informatio

Abstract: Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.

Abstract: A test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.

Abstract: Disclosed is a test device for testing a high-frequency and high-speed semiconductor. The test device includes a probe supporting block formed with a tube accommodating portion along a test direction; a conductive shield tube accommodated in the tube accommodating portion; and a probe accommodated and supported in the shield tube without contact, the tube accommodating portion including a conductive contact portion for transmitting a ground signal to the shield tube. When a high-frequency and high-speed semiconductor or the like subject is tested, the test device easily and inexpensively prevents crosstalk between the adjacent signal probes and improves impedance characteristic.

Abstract: Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.

Abstract: A probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.

Abstract: Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contact points connected to the printed circuit and applying a test signal to the object to be tested, and a substrate shielding portion formed in a thickness direction of the base substrate between the plurality of signal contact points; and a test socket comprising a plurality of signal pins to be in contact with the plurality of signal contact points, and a conductive block supporting the plurality of signal pins without contact. With this, a secure noise shield is made between lines for applying a test signal when a high-frequency and high-seed semiconductor is subjected to the test, thereby improving reliability of the test.

Abstract: Disclosed is a test device for testing a high-frequency and high-speed semiconductor. The test device includes a probe supporting block formed with a tube accommodating portion along a test direction; a conductive shield tube accommodated in the tube accommodating portion; and a probe accommodated and supported in the shield tube without contact, the tube accommodating portion including a conductive contact portion for transmitting a ground signal to the shield tube. When a high-frequency and high-speed semiconductor or the like subject is tested, the test device easily and inexpensively prevents crosstalk between the adjacent signal probes and improves impedance characteristic.

Abstract: A test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket block including a bottom surface facing toward the testing circuit, a top surface facing toward the test object, a plurality of probe holes for accommodating the plurality of signal probes to be parallel with one another while opposite ends of the signal probes are exposed from the top surface and the bottom surface, and a recessed portion recessed from at least partial area of the top surface and the bottom surface excluding a circumferential area of the probe holes; and an elastic grounding member accommodated in the recessed portion and made of a conductive elastic material to come into contact with at least one of the test object and the testing circuit.

Abstract: The radio frequency (RF) probe socket is disclosed. The probe socket includes a conductive noise shielding body configured to accommodate the plurality of signal probes to be parallel with one another while exposing opposite ends thereof, and shield noise; upper and lower noise shielding walls configured to be extended from the noise shielding body to some areas between the exposed opposite ends of the plurality of signal probes; and upper and lower holding members configured to be arranged on top and bottom sides of the noise shielding body, support the exposed opposite ends of the plurality of signal probes, and comprise accommodating grooves accommodate the noise shielding walls, respectively. With this, the noise shielding wall extended from the shielding block makes a shield between the signal probe pins passing through the upper and lower holding member, thereby preventing crosstalk between the signal probe pins.

Abstract: The present invention provides a dental treatment assisting tool which allows various foreign materials generated when teeth are being polished or plaque is being removed during dental treatment to be easily withdrawn to the outside without having to swallow and also allows breathing through the mouth. Specifically, the dental treatment assisting tool comprises: a base plate (1) having a generally circular shape on plane, having a concave upper side so that saliva or foreign materials can be easily collected to the center thereof, and having an elliptical spatial part (12) formed on one side thereof for a tongue to be seated therein; and an air supply pipe (2) which is a soft resin pipe connected to a hole (14) bored in the center of the base plate (1). Accordingly, during the dental treatment, the entire throat may be sealed in a breathable state for a patient.

Abstract: A test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.

Abstract: Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contact points connected to the printed circuit and applying a test signal to the object to be tested, and a substrate shielding portion formed in a thickness direction of the base substrate between the plurality of signal contact points; and a test socket comprising a plurality of signal pins to be in contact with the plurality of signal contact points, and a conductive block supporting the plurality of signal pins without contact. With this, a secure noise shield is made between lines for applying a test signal when a high-frequency and high-seed semiconductor is subjected to the test, thereby improving reliability of the test.

Abstract: A probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.

Abstract: A test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket block including a bottom surface facing toward the testing circuit, a top surface facing toward the test object, a plurality of probe holes for accommodating the plurality of signal probes to be parallel with one another while opposite ends of the signal probes are exposed from the top surface and the bottom surface, and a recessed portion recessed from at least partial area of the top surface and the bottom surface excluding a circumferential area of the probe holes; and an elastic grounding member accommodated in the recessed portion and made of a conductive elastic material to come into contact with at least one of the test object and the testing circuit.

Abstract: The radio frequency (RF) probe socket is disclosed. The probe socket includes a conductive noise shielding body configured to accommodate the plurality of signal probes to be parallel with one another while exposing opposite ends thereof, and shield noise; upper and lower noise shielding walls configured to be extended from the noise shielding body to some areas between the exposed opposite ends of the plurality of signal probes; and upper and lower holding members configured to be arranged on top and bottom sides of the noise shielding body, support the exposed opposite ends of the plurality of signal probes, and comprise accommodating grooves accommodate the noise shielding walls, respectively. With this, the noise shielding wall extended from the shielding block makes a shield between the signal probe pins passing through the upper and lower holding member, thereby preventing crosstalk between the signal probe pins.

Abstract: A shake correction module, a camera module including the same, and a method of manufacturing the camera module are provided. The shake correction module includes: a hinge member which supports rotation movement of an optical module based on each of at least two axes at least by using an elastic characteristic of the hinge member, wherein the optical module comprises an image sensor; a base member to which the hinge member is installed; and a driving motor which rotates the hinge member based on the each of the at least two axes with respect to the base member, in order to manufacture a structure for supporting two-axes rotation of the optical module to be simple and reliable with a low manufacturing cost.

Abstract: A method for preventing or treating a bone disease, includes administering to a patient having the bone disease a pharmaceutical composition comprising glyceollin as an active ingredient. The active ingredient, glyceollin promotes degradation of the Runx2 protein in osteoblasts and inhibits the mRNA expression of Rankl in osteoblasts to prevent the differentiation of osteoclasts. Furthermore, glyceollin is capable of ameliorating osteoporosis in animal models for osteoporosis. The composition promises drug or food for prevention or treatment of not only osteoporosis but also bone diseases caused by cancer metastatic to the bone.

Abstract: A shake correction module, a camera module including the same, and a method of manufacturing the camera module are provided. The shake correction module includes: a hinge member which supports rotation movement of an optical module based on each of at least two axes at least by using an elastic characteristic of the hinge member, wherein the optical module comprises an image sensor; a base member to which the hinge member is installed; and a driving motor which rotates the hinge member based on the each of the at least two axes with respect to the base member, in order to manufacture a structure for supporting two-axes rotation of the optical module to be simple and reliable with a low manufacturing cost.