Patents by Inventor Jaehyeong NO

Jaehyeong NO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170154682
    Abstract: A memory system includes: a memory apparatus suitable for providing read data; and a plurality of equalizing units respectively suitable for rotationally performing equalization operations to the read data in different directions in a two-dimensional inter-symbol interference (2D ISI) mask, wherein the 2D ISI mask comprises the read data of a victim cell and a plurality of interference data, which exert interferential influence on the read data, of interference cells neighboring the victim cell, and wherein a first one of the equalizing units generates a first equalization information by performing the equalization operation to the read data in a first one of the different directions based on a third equalization information received from a third one of the equalizing units, and provides the generated first equalization information to a second one of the equalizing units.
    Type: Application
    Filed: April 14, 2016
    Publication date: June 1, 2017
    Inventors: Jaekyun MOON, Jaehyeong NO
  • Patent number: 8817561
    Abstract: A method for estimating channel characteristics of a nonvolatile memory device including a plurality of memory cells includes the steps of: calculating first threshold voltage distributions of the memory cells programmed according to input data, based on the input data and a physical structure of the memory cells; calculating second threshold voltage distributions of the memory cells, based on output data and the physical structure of the memory cells; and analyzing the relation between the first and second threshold voltage distributions, using a mask.
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: August 26, 2014
    Assignees: SK Hynix Inc., Korea Advanced Institute of Science and Technology
    Inventors: Seok Hwan Choi, Joong Seob Yang, Seung Ho Chang, Sang Sik Kim, Sang Chul Lee, Ho Yeon Lee, Jaekyun Moon, Jaehyeong No
  • Publication number: 20140010031
    Abstract: A method for estimating channel characteristics of a nonvolatile memory device including a plurality of memory cells includes the steps of: calculating first threshold voltage distributions of the memory cells programmed according to input data, based on the input data and a physical structure of the memory cells; calculating second threshold voltage distributions of the memory cells, based on output data and the physical structure of the memory cells; and analyzing the relation between the first and second threshold voltage distributions, using a mask.
    Type: Application
    Filed: February 14, 2013
    Publication date: January 9, 2014
    Applicants: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, SK HYNIX INC.
    Inventors: Seok Hwan CHOI, Joong Seob YANG, Seung Ho CHANG, Sang Sik KIM, Sang Chul LEE, Ho Yeon LEE, Jaekyun MOON, Jaehyeong NO