Patents by Inventor Jae Hyun Baek
Jae Hyun Baek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11162695Abstract: Provided is an air conditioning system including: a case including a first sub-case including an outdoor air inlet and a discharge outlet, and a second sub-case including an air returning inlet and an air supply inlet; a desiccant rotor module; a heat exchanger including a first sub-heat exchanger and a second sub-heat exchanger, a ventilator including a first sub-ventilator and a second sub-ventilator; and a damper including a first sub-damper and a second sub-damper, wherein the first sub-damper is installed downstream of the first region of the desiccant rotor module, and the second sub-damper is installed downstream of the second region of the desiccant rotor module, wherein the desiccant rotor module and the heat exchanger are integrally assembled so as to be detachably installed in the case, wherein the outdoor air and the indoor air do not mix with each other.Type: GrantFiled: August 31, 2018Date of Patent: November 2, 2021Assignee: Korea Institute of Science and TechnologyInventors: Dae Young Lee, Jae Hyun Baek, Sung Chul Shin
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Patent number: 10238800Abstract: An electronic device and a method of operating the electronic device are provided. The method includes sensing a weight of an intravenous (IV) fluid injected into a user; measuring a time remaining until injection of the IV fluid is completed, based on the sensed weight of the IV fluid; determining whether the measured remaining time is equal to or less than a predetermined value; and transmitting an alarm signal indicating an injection state of the IV fluid to an external device based on a result of the determining.Type: GrantFiled: November 21, 2017Date of Patent: March 26, 2019Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jae-hyun Baek, Sung-hoon Moon, Jin-ha Seong, Geon-ho Yoon, Wan-hyoung Lee
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Publication number: 20190063762Abstract: Provided is an air conditioning system including: a case including a first sub-case including an outdoor air inlet and a discharge outlet, and a second sub-case including an air returning inlet and an air supply inlet; a desiccant rotor module; a heat exchanger including a first sub-heat exchanger and a second sub-heat exchanger, a ventilator including a first sub-ventilator and a second sub-ventilator; and a damper including a first sub-damper and a second sub-damper, wherein the first sub-damper is installed downstream of the first region of the desiccant rotor module, and the second sub-damper is installed downstream of the second region of the desiccant rotor module, wherein the desiccant rotor module and the heat exchanger are integrally assembled so as to be detachably installed in the case, wherein the outdoor air and the indoor air do not mix with each other.Type: ApplicationFiled: August 31, 2018Publication date: February 28, 2019Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGYInventors: Dae Young LEE, Jae Hyun BAEK, Sung Chul SHIN
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Publication number: 20180140771Abstract: An electronic device and a method of operating the electronic device are provided. The method includes sensing a weight of an intravenous (IV) fluid injected into a user; measuring a time remaining until injection of the IV fluid is completed, based on the sensed weight of the IV fluid; determining whether the measured remaining time is equal to or less than a predetermined value; and transmitting an alarm signal indicating an injection state of the IV fluid to an external device based on a result of the determining.Type: ApplicationFiled: November 21, 2017Publication date: May 24, 2018Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jae-hyun BAEK, Sung-hoon MOON, Jin-ha SEONG, Geon-ho YOON, Wan-hyoung LEE
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Patent number: 9293226Abstract: A memory test device for testing a memory device is provided. The memory test device includes a sequencer configured to output first and second sequencer outputs that are different from each other in response to a sequencer input. A first pattern generator is configured to output a first test pattern according to the first sequencer output. A second pattern generator is configured to output a second test pattern according to the second sequencer output. A selector is coupled to the first and second pattern generators and configured to output write data according to the first test pattern and the second test pattern.Type: GrantFiled: July 28, 2014Date of Patent: March 22, 2016Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jae Hyun Baek, Jae Moo Choi, Jae Hee Han, In Su Yang, Hyun Soo Jung
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Patent number: 9229057Abstract: A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.Type: GrantFiled: May 31, 2012Date of Patent: January 5, 2016Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sung Yeol Kim, In-su Yang, Min Sung Kim, Jae Hyun Baek, Jin-Kyu Choi, Ho Sun Yoo
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Publication number: 20150100838Abstract: A memory test device for testing a memory device is provided. The memory test device includes a sequencer configured to output first and second sequencer outputs that are different from each other in response to a sequencer input. A first pattern generator is configured to output a first test pattern according to the first sequencer output. A second pattern generator is configured to output a second test pattern according to the second sequencer output. A selector is coupled to the first and second pattern generators and configured to output write data according to the first test pattern and the second test pattern.Type: ApplicationFiled: July 28, 2014Publication date: April 9, 2015Inventors: Jae Hyun BAEK, Jae Moo CHOI, Jae Hee HAN, In Su YANG, Hyun Soo JUNG
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Publication number: 20120326738Abstract: A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.Type: ApplicationFiled: May 31, 2012Publication date: December 27, 2012Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sung Yeol Kim, In-Su Yang, Min Sung Kim, Jae Hyun Baek, Jin-Kyu Choi, Ho Sun Yoo