Patents by Inventor Jaime Rene De La Cruz Vasquez

Jaime Rene De La Cruz Vasquez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration of camera and projector
    Patent number: 11284050
    Abstract: Described examples include a system including a projector configured to project a test pattern image, the test pattern image having at least two elements; a camera configured to capture the test pattern image; and a controller coupled to the projector and to the camera. The controller is configured to obtain a first calibration matrix between the projector and the camera for the at least two elements; determine at least two epipolar lines based on the first calibration matrix and the test pattern image; determine a cost function based on the at least two epipolar lines and the at least two elements in the test pattern image as captured by the camera; and determine a second calibration matrix responsive to the cost function, wherein at least one of a camera position of the camera or a projector position of the projector is adjusted responsive to the second calibration matrix.
    Type: Grant
    Filed: February 11, 2021
    Date of Patent: March 22, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Shashank Dabral, Jaime Rene De La Cruz Vasquez, Jeffrey Matthew Kempf
  • CALIBRATION OF CAMERA AND PROJECTOR
    Publication number: 20220086408
    Abstract: Described examples include a system including a projector configured to project a test pattern image, the test pattern image having at least two elements; a camera configured to capture the test pattern image; and a controller coupled to the projector and to the camera. The controller is configured to obtain a first calibration matrix between the projector and the camera for the at least two elements; determine at least two epipolar lines based on the first calibration matrix and the test pattern image; determine a cost function based on the at least two epipolar lines and the at least two elements in the test pattern image as captured by the camera; and determine a second calibration matrix responsive to the cost function, wherein at least one of a camera position of the camera or a projector position of the projector is adjusted responsive to the second calibration matrix.
    Type: Application
    Filed: February 11, 2021
    Publication date: March 17, 2022
    Inventors: Shashank Dabral, Jaime Rene De La Cruz Vasquez, Jeffrey Matthew Kempf